Relaxor-like behavior of Pb.5Ca.5TiO3 thin films

被引：8

作者：

Jimenez, R ^{[1
]}

Alemany, C ^{[1
]}

Calzada, ML ^{[1
]}

Mendiola, J ^{[1
]}

机构：

[1] CSIC, Inst Ciencia Mat Madrid, Madrid 28049, Spain

来源：

FERROELECTRICS | 2004年 / 302卷

关键词：

Thin Film; relaxor; ferroelectric; dielectric;

D O I：

10.1080/00150190490455115

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Single phase thin films of ferroelectric Pb.Ca-5.5TiO3 were deposited onto Pt/TiO2/ SiO2/Si(100) substrates by spin-on sol-gel process. The films show large diffusivity in the dielectric constant variation with temperature and frequency dispersion of the temperature of the dielectric constant maxima, T-mK,. From polarization-temperature measurements, remnant polarization persists well above the dielectric constant maximum (close to 297 K). These all properties are characteristics of relaxor ferroelectrics as previously proposed in the literature for Pb.Ca-5.5TiO3 bulk ceramics, reported for first time as thin films. The Vogel-Fulchner relation is fulfilled for the frequency dependence of the temperature of the maximum of dielectric constant, T-mK. As usually detected in thin films, diffusivity of the dielectric constant is very large, and its values lowered with respect to the bulk ceramic counterpart. Possible aplication of these films as DRAM and varactors is discussed.

引用

页码：461 / 466

页数：6

共 11 条

[1]

BRETOS I, 13 EMF

[2] Effect of thermal expansion mismatch on the dielectric peak temperature of thin film relaxors [J].