Investigation of ion bombarded polymer surfaces using SIMS, XPS and AFM

Among various surface modification techniques, ion beam bombardment has been used to study the effect of. modification on polymer surface properties. The surface of polyethylene, polypropylene, polystyrene and polyimide was bombarded with Ar+ 500 eV, 50 keV, 100 keV and N+ 50 keV, 100 keV. Common surface analytical techniques such as SIMS, XPS and AFM were used to characterize the ion bombarded polymer surfaces, Matrix effect changes and X-ray induced Auger electron spectra have been also monitored to give a better understanding of the ion bombarded polymer surfaces. The benzene ring component of polymer plays an important role in the increase of the valence electron density and in the delocalization process of the excess charge during ion bombardment. Matrix effect chances accompanied by the reduction of the ionization probability of hydrogen were observed at the ion bombarded polymer surfaces.