Breaking resolution limits in ultrafast electron diffraction and microscopy

被引:164
作者
Baum, Peter
Zewail, Ahmed H. [1 ]
机构
[1] CALTECH, Phys Biol Ctr Ultrafast Sci & Technol, Pasadena, CA 91125 USA
[2] CALTECH, Lab Mol Sci, Pasadena, CA 91125 USA
关键词
ultrafast imaging; femtosecond electron pulses; electron autocorrelation;
D O I
10.1073/pnas.0607451103
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Ultrafast electron microscopy and diffraction are powerful techniques for the study of the time-resolved structures of molecules, materials, and biological systems. Central to these approaches is the use of ultrafast coherent electron packets. The electron pulses typically have an energy of 30 keV for diffraction and 100-200 keV for microscopy, corresponding to speeds of 33-70% of the speed of light. Although the spatial resolution can reach the atomic scale, the temporal resolution is limited by the pulse width and by the difference in group velocities of electrons and the light used to initiate the dynamical change. In this contribution, we introduce the concept of tilted optical pulses into diffraction and imaging techniques and demonstrate the methodology experimentally. These advances allow us to reach limits of time resolution down to regimes of a few femtoseconds and, possibly, attoseconds. With tilted pulses, every part of the sample is excited at precisely the same time as when the electrons arrive at the specimen. Here, this approach is demonstrated for the most unfavorable case of ultrafast crystallography. We also present a method for measuring the duration of electron packets by autocorrelating electron pulses in free space and without streaking, and we discuss the potential of tilting the electron pulses themselves for applications in domains involving nuclear and electron motions.
引用
收藏
页码:16105 / 16110
页数:6
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