Relationships among ferroelectric fatigue, electronic charge trapping, defect-dipoles, and oxygen vacancies in perovskite oxides

被引:34
作者
Warren, WL
Dimos, D
Tuttle, BA
Pike, GE
AlShareef, HN
机构
[1] Sandia National Laboratories, Albuquerque
关键词
THIN-FILM CAPACITORS; PHOTOINDUCED HYSTERESIS CHANGES; BATIO3; PB(ZR; TI)O-3; MEMORIES; CERAMICS; LIGHT;
D O I
10.1080/10584589708013031
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using electron paramagnetic resonance, it is shown that the reduction of the switchable polarization in BaTiO3 crystals by repeated polarization reversals (fatigue) is accompanied by the trapping of electronic charge at isolated acceptor impurities and atomic scale distortions in the perovskite oxygen octahedron. The distortions are proposed to entail nearby oxygen vacancies. Our results suggest that the suppressed polarization state arises by trapping electronic charge carriers at domain walls; the trapped electronic charge can become thermally stabilized by fatigue-induced distortions in the oxygen octahedron. The octahedron distortions are shown to be unique to fatigue-induced degradation; they are not observed in BaTiO3 capacitors that have an optically-induced suppressed polarization state.
引用
收藏
页码:77 / 86
页数:10
相关论文
共 38 条
[1]  
AlShareef HN, 1996, APPL PHYS LETT, V68, P690, DOI 10.1063/1.116593
[2]  
ALSHAREEF HN, 1994, J MATER RES, V9, P2960
[3]   FATIGUE-FREE FERROELECTRIC CAPACITORS WITH PLATINUM-ELECTRODES [J].
DEARAUJO, CAP ;
CUCHIARO, JD ;
MCMILLAN, LD ;
SCOTT, MC ;
SCOTT, JF .
NATURE, 1995, 374 (6523) :627-629
[4]  
DESU SB, 1992, INTEGR FERROELECTR, P323
[5]   PHOTOINDUCED HYSTERESIS CHANGES AND OPTICAL STORAGE IN (PB,LA)(ZR,TI)O3 THIN-FILMS AND CERAMICS [J].
DIMOS, D ;
WARREN, WL ;
SINCLAIR, MB ;
TUTTLE, BA ;
SCHWARTZ, RW .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (07) :4305-4315
[6]  
DIMOS D, UNPUB J APPL PHYS
[7]   FATIGUE AND SWITCHING IN FERROELECTRIC MEMORIES - THEORY AND EXPERIMENT [J].
DUIKER, HM ;
BEALE, PD ;
SCOTT, JF ;
DEARAUJO, CAP ;
MELNICK, BM ;
CUCHIARO, JD ;
MCMILLAN, LD .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (11) :5783-5791
[8]   FERROELECTRIC PROPERTIES AND FATIGUE OF PBZR0.51TI0.49O3 THIN-FILMS OF VARYING THICKNESS - BLOCKING LAYER MODEL [J].
LARSEN, PK ;
DORMANS, GJM ;
TAYLOR, DJ ;
VANVELDHOVEN, PJ .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (04) :2405-2413
[9]   EFFECTS OF CRYSTALLINE QUALITY AND ELECTRODE MATERIAL ON FATIGUE IN PB(ZR, TI)O3 THIN-FILM CAPACITORS [J].
LEE, J ;
JOHNSON, L ;
SAFARI, A ;
RAMESH, R ;
SANDS, T ;
GILCHRIST, H ;
KERAMIDAS, VG .
APPLIED PHYSICS LETTERS, 1993, 63 (01) :27-29
[10]   EFFECT OF ULTRAVIOLET-LIGHT ON FATIGUE OF LEAD-ZIRCONATE-TITANATE THIN-FILM CAPACITORS [J].
LEE, J ;
ESAYAN, S ;
SAFARI, A ;
RAMESH, R .
APPLIED PHYSICS LETTERS, 1994, 65 (02) :254-256