Comment on "Determination of phonon dispersions from x-ray transmission scattering: The example of silicon" - Holt and Chiang reply

被引:7
作者
Holt, M [1 ]
Chiang, TC
机构
[1] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
[2] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA
关键词
D O I
10.1103/PhysRevLett.84.3734
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:3734 / 3734
页数:1
相关论文
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