Thin film transistors are fabricated by in situ growth of SnO2 nanobelts on Au/Pt electrodes. A linear correlation in the output characteristics is observed at zero gate voltage, indicating Ohmic contacts between the nanobelts and the electrodes. The transistors exhibit n-type behaviors and have a mobility of 1.85 cm(2)/V s with a current on/off ratio above 10(3). The conductance increases as the pressure in the device chamber is reduced, which indicates that the transistors are promising for oxygen detecting. (C) 2004 American Institute of Physics.