Wetting of grain boundaries in ceramic materials

被引：14

作者：

Belousov, VV

机构：

[1] Moscow MV Lomonosov State Univ, Moscow 119992, Russia

[2] Res Inst Steel, Moscow 127411, Russia

来源：

COLLOID JOURNAL | 2004年 / 66卷 / 02期

关键词：

D O I：

10.1023/B:COLL.0000023110.23942.6c

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Wetting of grain boundaries plays an important role in such processes as liquid phase sintering, high-temperature creep, electrical, and mass transport, as well as in the production of ceramic resistors, varistors, capacitors, ionic conductors, and high-temperature superconductors. Current state of the studies devoted to the problem of grain boundary wetting in ceramic materials is reviewed.

引用

收藏

页码：121 / 127

页数：7

相关论文

共 81 条

[41] STATISTICAL-ANALYSIS OF THE INTERGRANULAR FILM THICKNESS IN SILICON-NITRIDE CERAMICS [J].

KLEEBE, HJ ;

CINIBULK, MK ;

CANNON, RM ;

RUHLE, M .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1993, 76 (08) :1969-1977

[42] Structure and chemistry of interfaces in Si3N4 ceramics studied by transmission electron microscopy [J].

Kleebe, HJ .

JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 1997, 105 (06) :453-475

[43] The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic composites [J].

Knowles, KM ;

Turan, S .

ULTRAMICROSCOPY, 2000, 83 (3-4) :245-259

[44]

KRYLOV DA, 1992, USPEKHI KOLLOIDNOI K

[45] IMPURITY PHASES IN HOT-PRESSED SI3N4 [J].

LOU, LKV ;

MITCHELL, TE ;

HEUER, AH .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1978, 61 (9-10) :392-396

[46] Origin of solid-state activated sintering in Bi2O3-doped ZnO [J].

Luo, J ;

Wang, HF ;

Chiang, YM .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1999, 82 (04) :916-920

[47]

LYSKOV NV, 2003, DOKL CHEM, V392, P63

[48]

Maksimov EG, 2000, USP FIZ NAUK+, V170, P1033, DOI 10.1070/PU2000v043n10ABEH000770

[49] INTERFACE PHASE-TRANSITION - COMPLETE TO PARTIAL WETTING [J].

MOLDOVER, MR ;

CAHN, JW .

SCIENCE, 1980, 207 (4435) :1073-1075

[50] The electron microscope: The materials characterization tool of the millennium [J].

Newbury, DE ;

Williams, DB .

ACTA MATERIALIA, 2000, 48 (01) :323-346

← 1 2 3 4 5 6 7 8 9 →