Intrinsic Josephson effects in submicrometre Bi2212 mesas fabricated by using focused ion beam etching

被引：5

作者：

Winkler, D

Mros, N

Tarte, EJ

Yurgens, A

Krasnov, VM

Foord, DT

Booij, WE

Blamire, MG

机构：

[1] Chalmers Univ Technol, Dept Microelect & Nanosci, SE-41296 Gothenburg, Sweden

[2] Univ Cambridge, IRC Superconduct, Cambridge CB3 0HE, England

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1999年 / 12卷 / 11期

关键词：

D O I：

10.1088/0953-2048/12/11/395

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have investigated the current-voltage (I-V) characteristics of sub-mu m sized mesas made the surface of Bi2Sr2CaCu2O8 (Bi2212) single crystals. The mesas were fabricated using focused ion beam etching. The samples showed excellent I-V characteristics and their conductance-voltage (G-V) curves were measured from above the transition temperature down to 4.2 K. New ways of making annular mesas with diameters down to 0.5 mu m were also investigated.

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页码：1013 / 1015

页数：3

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