Characteristics of the beam line at the Tokyo electron beam ion trap

被引:23
作者
Shimizu, H [1 ]
Currell, FJ
Ohtani, S
Sokell, EJ
Yamada, C
Hirayama, T
Sakurai, M
机构
[1] Japan Sci & Technol Co, ICORP, Cold Trapped Ions Project, Tokyo 1820024, Japan
[2] Univ Electrocommun, Tokyo 1828585, Japan
[3] Gakushuin Univ, Fac Sci, Tokyo 1718588, Japan
[4] Kobe Univ, Dept Phys, Kobe, Hyogo 6578501, Japan
关键词
D O I
10.1063/1.1150259
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new beam line has been constructed to make various experiments with highly charged ions produced in an electron beam ion trap. The characteristics of the beam line are reported. Ions are extracted upward into the beam line and are deflected horizontally and analyzed for the charge states by a double-focusing magnet. To obtain sufficient intensity, several electrostatic lenses are located. A quadrupole lens is used to correct the distorted beam shape before an entrance slit of the magnet. Ions are accelerated during the passing of the analyzing magnet to obtain the higher mass resolution. Trajectories were calculated by a ray-tracing program and matrix multiplication for lens actions. Preliminary results are shown here for investigation of characteristics of extracted ions. (C) 2000 American Institute of Physics. [S0034-6748(00)56402-8].
引用
收藏
页码:681 / 683
页数:3
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