Characteristics of the Tokyo Electron-Beam Ion Trap

被引：58

作者：

Watanabe, H ^{[1
]}

Asada, J

Currell, FJ

Fukami, T

Hirayama, T

Motohashi, K

Nakamura, N

Nojikawa, E

Ohtani, S

Okazaki, K

Sakurai, M

Shimizu, H

Tada, N

Tsurubuchi, S

机构：

[1] Kyoto Univ, Fac Engn, Kyoto 60601, Japan

[2] Univ Electrocommun, Inst Laser Sci, Tokyo 182, Japan

[3] Gakushuin Univ, Fac Sci, Tokyo 171, Japan

[4] Tokyo Univ Agr & Technol, Fac Technol, Tokyo 184, Japan

[5] Japan Sci & Technol Corp, Tokyo 182, Japan

[6] Inst Phys & Chem Res, RIKEN, Wako, Saitama 351, Japan

[7] Inst Mol Sci, Aichi 444, Japan

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1997年 / 66卷 / 12期

关键词：

ion trap; EBIT; highly charged ions; ion source; X-ray spectra;

D O I：

10.1143/JPSJ.66.3795

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have constructed a new Electron Beam Ion Trap (EBIT). Over recent months, we have operated this device and obtained some experimental results. In this paper, we show the performance of this EBIT by illustrating these results.

引用

页码：3795 / 3800

页数：6

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