Fluorinated aminoalkoxide CuII complexes:: new CVD precursors for deposition of copper metal

被引:38
作者
Chi, Y [1 ]
Hsu, PF
Liu, CS
Ching, WL
Chou, TY
Carty, AJ
Peng, SM
Lee, GH
Chuang, SH
机构
[1] Natl Tsing Hua Univ, Dept Chem, Hsinchu 30013, Taiwan
[2] Natl Res Council Canada, Steacie Inst Mol Sci, Ottawa, ON K1A 0R6, Canada
[3] Natl Taiwan Univ, Dept Chem, Taipei 10764, Taiwan
[4] Natl Taiwan Univ, Instrumentat Ctr, Taipei 10764, Taiwan
[5] Natl Nano Device Labs, Hsinchu 30050, Taiwan
关键词
D O I
10.1039/b205419a
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Volatile low-melting Cu-II metal complexes of formula Cu[OC(CF3)(RCH2NHR2)-C-1](2) (R-1 = CF3 or CH3; R-2 = CH2CH2OMe, Bu-i, or Bu-t) and Cu[OC(CF3)(RCH2NMe2)-C-1](2) (R-1 = CF3 or CH3) have been synthesized and characterized by spectroscopic methods. A single-crystal X-ray diffraction study on Cu[OC(CF3)(2)CH2NHCH2CH2OMe](2) shows that one methoxyethyl group of the aminoalkoxide ligand forms an intramolecular dative bond to the Cu atom to produce a square-pyramidal geometry at the metal center, while the second is linked to the Cu atom of the adjacent molecule, giving an N2O4 octahedral coordination arrangement. For the second Bu-i-substituted complex, Cu[OC(CF3)(2)CH2NHBui](2), the X-ray structural analysis demonstrated an N2O2 square-planar geometry, with one alkoxide oxygen atom forming strong H-bonding to an adjacent water molecule. Metal CVD experiments were carried out, showing that the source reagents Cu[OC(CF3)(2)CH2NHBui](2), Cu[OC(CF3)(2)CH2NHBut](2), and Cu[OCMe(CF3)CH2NHBui](2), which possess a secondary amino group, are capable of depositing copper metal at temperatures of 250-300 degreesC under inert Ar carrier gas, while Cu[OCMe(CF3)CH2NMe2](2), with a tertiary amine group, requires the use of reductive H-2 carrier gas to induce metal deposition at lower temperatures.
引用
收藏
页码:3541 / 3550
页数:10
相关论文
共 58 条
[1]   THE EFFECT OF ADDING HEXAFLUOROACETYLACETONE ON CHEMICAL-VAPOR-DEPOSITION OF COPPER USING CU(I) AND CU(II) PRECURSOR SYSTEMS [J].
AWAYA, N ;
OHNO, K ;
ARITA, Y .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (09) :3173-3179
[2]   LOW-TEMPERATURE CHEMICAL VAPOR-DEPOSITION OF HIGH-PURITY COPPER FROM AN ORGANOMETALLIC SOURCE [J].
BEACH, DB ;
LEGOUES, FK ;
HU, CK .
CHEMISTRY OF MATERIALS, 1990, 2 (03) :216-219
[3]   Alcohol-assisted growth of copper CVD films [J].
Borgharkar, NS ;
Griffin, GL ;
James, A ;
Maverick, AW .
THIN SOLID FILMS, 1998, 320 (01) :86-94
[4]   Toward a unified reaction mechanism for chemical vapor deposition of copper [J].
Borgharkar, NS ;
Griffin, GL .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1998, 145 (01) :347-352
[5]   Nucleation and growth of Cu films during the initial stage of chemical vapor deposition [J].
Chae, YK ;
Komiyama, H .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (07) :3610-3613
[6]  
Chang CH, 2001, ANGEW CHEM INT EDIT, V40, P4651, DOI 10.1002/1521-3773(20011217)40:24<4651::AID-ANIE4651>3.0.CO
[7]  
2-X
[8]   FLUORINATED ALKOXIDES .11. STUDIES ON HIGHLY FLUORINATED AMINO-ALCOHOLS AND THEIR METAL DERIVATIVES [J].
CHANG, IS ;
WILLIS, CJ .
CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1977, 55 (13) :2465-2472
[9]   2-methyl-1-hexen-3-yne Lewis base stabilized, β-diketonate copper(I) complexes:: X-ray structures, theoretical study, and low-temperature chemical vapor deposition of copper metal [J].
Chen, TY ;
Vaissermann, J ;
Ruiz, E ;
Sénateur, JP ;
Doppelt, P .
CHEMISTRY OF MATERIALS, 2001, 13 (11) :3993-4004
[10]   CU CVD FROM COPPER(II) HEXAFLUOROACETYLACETONATE .1. A COLD-WALL REACTOR DESIGN, BLANKET GROWTH-RATE, AND NATURAL SELECTIVITY [J].
CHEN, YD ;
REISMAN, A ;
TURLIK, I ;
TEMPLE, D .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (11) :3903-3911