Mechanical characterization of PEDOT:PSS thin films

被引：299

作者：

Lang, Udo ^{[1
]}

Naujoks, Nicola ^{[2
]}

Dual, Jurg ^{[1
]}

机构：

[1] Inst Mech Syst, Dept Mech & Proc Engn, CH-8092 Zurich, Switzerland

[2] Swiss Fed Inst Technol, Dept Mech & Proc Engn, Nanotechnol Grp, CH-8092 Zurich, Switzerland

来源：

SYNTHETIC METALS | 2009年 / 159卷 / 5-6期

关键词：

PEDOT:PSS; Thin film; Tensile tests; Mechanical behaviour; Young's modulus; AFM; Morphology; PHOTOELECTRON-SPECTROSCOPY; PEDOT/PSS FILMS; CONDUCTIVITY; MORPHOLOGY;

D O I：

10.1016/j.synthmet.2008.11.005

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

By tensile testing the mechanical properties of thin films of the intrinsically conductive poly(3,4-ethylenedioxythiophene) poly(styrene sulfonate) (PEDOT:PSS) under different relative humidities are investigated. It can be shown that the fracture behaviour strongly depends on humidity and reaches from brittle to plastic. The fracture surfaces are first investigated by scanning electron microscopy (SEM). The surfaces change from smooth at 23% rH to rough with shear lips for samples tested at 55% rH. Atomic force microscopy then reveals the topography of fracture surfaces at the nanometer scale and thus gives insights into the morphology of PEDOT:PSS thin films. By combining the experimental findings of the tensile tests and the AFM scans a micromechanical model for the deformation behavior of PEDOT:PSS can then be derived. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：473 / 479

页数：7

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