Solubility of nitrogen and phosphorus in 4H-SiC: A theoretical study

被引:51
作者
Bockstedte, M [1 ]
Mattausch, A [1 ]
Pankratov, O [1 ]
机构
[1] Univ Erlangen Nurnberg, Lehrstuhl Theoret Festkorperphys, D-91058 Erlangen, Germany
关键词
D O I
10.1063/1.1769075
中图分类号
O59 [应用物理学];
学科分类号
摘要
The n-type dopants phosphorus and nitrogen, and their complexes with intrinsic point defects are investigated in 4H-SiC by first-principles theory. The solubility and electrical activation of the dopants in thermodynamic equilibrium are calculated. For nitrogen, a saturation of the electrical activation above a certain critical concentration is found that is driven by a preferential incorporation of nitrogen into electrically passive nitrogen-vacancy complexes. This explains the observations of recent experiments. An almost complete phosphorus activation is found up to the solubility limit. We suggest that the low phosphorus doping achieved by sublimation growth is related to the growth kinetics. (C) 2004 American Institute of Physics.
引用
收藏
页码:58 / 60
页数:3
相关论文
共 19 条
[1]   Nitrogen passivation by implantation-induced point defects in 4H-SiC epitaxial layers [J].
Åberg, D ;
Hallén, A ;
Pellegrino, P ;
Svensson, BG .
APPLIED SURFACE SCIENCE, 2001, 184 (1-4) :263-267
[2]   Nitrogen deactivation by implantation-induced defects in 4H-SiC epitaxial layers [J].
Åberg, D ;
Hallén, A ;
Pellegrino, P ;
Svensson, BG .
APPLIED PHYSICS LETTERS, 2001, 78 (19) :2908-2910
[3]  
Augustine G, 1997, PHYS STATUS SOLIDI B, V202, P137, DOI 10.1002/1521-3951(199707)202:1<137::AID-PSSB137>3.0.CO
[4]  
2-Y
[5]   CALCULATION OF THE TOTAL ENERGY OF CHARGED POINT-DEFECTS USING THE GREENS-FUNCTION TECHNIQUE [J].
BARAFF, GA ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1984, 30 (04) :1853-1866
[6]   Ab initio study of the migration of intrinsic defects in 3C-SiC -: art. no. 205201 [J].
Bockstedte, M ;
Mattausch, A ;
Pankratov, O .
PHYSICAL REVIEW B, 2003, 68 (20)
[7]   Phosphorus implantation into 4H-silicon carbide [J].
Capano, MA ;
Santhakumar, R ;
Venugopal, R ;
Melloch, MR ;
Cooper, JA .
JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (02) :210-214
[8]   Ionization energies and electron mobilities in phosphorus- and nitrogen-implanted 4H-silicon carbide [J].
Capano, MA ;
Cooper, JA ;
Melloch, MR ;
Saxler, A ;
Mitchel, WC .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (12) :8773-8777
[9]   Formation and annealing of nitrogen-related complexes in SiC [J].
Gerstmann, U ;
Rauls, E ;
Frauenheim, T ;
Overhof, H .
PHYSICAL REVIEW B, 2003, 67 (20)
[10]  
GreulichWeber S, 1997, PHYS STATUS SOLIDI A, V162, P95, DOI 10.1002/1521-396X(199707)162:1<95::AID-PSSA95>3.0.CO