Scanning gate spectroscopy on nanoclusters

被引：25

作者：

Gurevich, L

Canali, L

Kouwenhoven, LP

机构：

[1] Delft Univ Technol, Dept Appl Phys, NL-2600 GA Delft, Netherlands

[2] Delft Univ Technol, DIMES, NL-2600 GA Delft, Netherlands

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 03期

关键词：

D O I：

10.1063/1.125761

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A gated probe for scanning tunneling microscopy (STM) has been developed. The probe extends normal STM operations by means of an additional electrode fabricated next to the tunneling tip. The extra electrode does not make contact with the sample and can be used as a gate. We report on the recipe used for fabricating the tunneling tip and the gate electrode on a silicon nitride cantilever. We demonstrate the functioning of the scanning gate probes by performing single-electron tunneling spectroscopy on 20-nm-gold clusters for different gate voltages. (C) 2000 American Institute of Physics. [S0003-6951(00)00103-0].

引用

页码：384 / 386

页数：3

共 9 条

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