Low-temperature photoluminescence of epitaxial InAs

被引:55
作者
Lacroix, Y
Tran, CA
Watkins, SP
Thewalt, MLW
机构
[1] Department of Physics, Simon Fraser University, Burnaby
[2] EMCORE Corp., Sommerset
关键词
D O I
10.1063/1.363660
中图分类号
O59 [应用物理学];
学科分类号
摘要
Photoluminescence studies as well as reflectance and transmittance measurements were performed on high-purity epitaxial InAs grown by metal-organic chemical-vapor deposition. We report the optical identification of excitonic, donor, and acceptor impurity related transitions at a temperature of 1.4 K. Measurements at higher temperature and in the presence of magnetic fields up to 7 T support these identifications. We find the excitonic band gap at 415.65 +/- 0.01 meV according to the minimum in the polariton reflectance feature. The donor-acceptor-pair and acceptor-bound exciton transitions for three different accepters are observed by photoluminescence, and we tentatively associate one of them to a double acceptor formed by a Ga impurity on an As lattice site. A donor-bound exciton transition is observed with a binding energy of 0.42 meV. The magnetic field dependence yields values of the electron effective mass and g factor of (0.026 +/- 0.002)m(0) and -15.3 +/- 0.2, respectively, in good agreement with values obtained by other techniques. Furthermore, we report a deep luminescence band of unknown origin at similar to 375 meV, related to drastic temporal changes in the band-edge photoluminescence intensity. (C) 1996 American Institute of Physics.
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页码:6416 / 6424
页数:9
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