Ultrafast phase transitions after femtosecond laser irradiation of indium phosphide

被引:15
作者
Bonse, J [1 ]
Wiggins, SM [1 ]
Solis, J [1 ]
机构
[1] CSIC, Inst Opt, E-28006 Madrid, Spain
关键词
D O I
10.1063/1.1776311
中图分类号
O59 [应用物理学];
学科分类号
摘要
The structural transformation dynamics of single-crystalline indium phosphide irradiated with 150 fs laser pulses at 800 nm has been investigated by means of time-resolved reflectivity measurements covering a time window from 150 fs up to 500 ns. The results obtained show that for fluences above the threshold of 0.16 J/cm(2) thermal melting of the material occurs on the time scale of 1-2 ps, while ablation at higher fluences (>0.23 J/cm(2)) is preceeded by an ultrafast phase transition ("nonthermal melting") occurring within 400 fs after the arrival of the pulse to the surface. The evolution of the reflectivity on a longer time scale shows a resolidification time typically around 25 ns after which an amorphous layer several tens of nanometer thick is formed on the surface. (C) 2004 American Institute of Physics.
引用
收藏
页码:2628 / 2631
页数:4
相关论文
共 27 条
[1]
PHASE-EQUILIBRIA AND VAPOR-PRESSURES OF PURE PHOSPHORUS AND OF INDIUM-PHOSPHORUS SYSTEM AND THEIR IMPLICATIONS REGARDING CRYSTAL-GROWTH OF INP [J].
BACHMANN, KJ ;
BUEHLER, E .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (06) :835-846
[2]
Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy [J].
Bonse, J ;
Brzezinka, KW ;
Meixner, AJ .
APPLIED SURFACE SCIENCE, 2004, 221 (1-4) :215-230
[3]
Ultrashort-pulse laser ablation of indium phosphide in air [J].
Bonse, J ;
Wrobel, JM ;
Krüger, J ;
Kautek, W .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 72 (01) :89-94
[4]
Femtosecond laser irradiation of indium phosphide in air: Raman spectroscopic and atomic force microscopic investigations [J].
Bonse, J ;
Wrobel, JM ;
Brzezinka, KW ;
Esser, N ;
Kautek, W .
APPLIED SURFACE SCIENCE, 2002, 202 (3-4) :272-282
[5]
Femtosecond laser pulse ablation of GaAs and InP: studies utilizing scanning and transmission electron microscopy [J].
Borowiec, A ;
MacKenzie, M ;
Weatherly, GC ;
Haugen, HK .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2003, 77 (3-4) :411-417
[6]
Optoelectronic system integration using InP-based HBTS for lightwave communications [J].
Chandrasekhar, S .
SOLID-STATE ELECTRONICS, 1997, 41 (10) :1413-1417
[7]
Dargys A, 1994, Handbook on Physical Properties of Ge, Si, GaAs and InP
[8]
GLEMBOCKI OJ, 1998, HDB OPTICAL CONSTANT
[9]
Nonequilibrium phonon dynamics and electron distribution functions in InP and InAs [J].
Grann, ED ;
Tsen, KT ;
Ferry, DK .
PHYSICAL REVIEW B, 1996, 53 (15) :9847-9851
[10]
SUBPICOSECOND THERMALIZATION AND RELAXATION OF HIGHLY PHOTOEXCITED ELECTRONS AND HOLES IN INTRINSIC AND P-TYPE GAAS AND INP [J].
HOHENESTER, U ;
SUPANCIC, P ;
KOCEVAR, P ;
ZHOU, XQ ;
KUTT, W ;
KURZ, H .
PHYSICAL REVIEW B, 1993, 47 (20) :13233-13245