Optically detected cyclotron resonance investigations on 4H and 6H SiC:: Band-structure and transport properties

被引:21
作者
Meyer, BK [1 ]
Hofmann, DM
Volm, D
Chen, WM
Son, NT
Janzén, E
机构
[1] Univ Giessen, Inst Phys 1, D-35392 Giessen, Germany
[2] Tech Univ Munich, Phys Dept E 16, D-85747 Garching, Germany
[3] Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden
来源
PHYSICAL REVIEW B | 2000年 / 61卷 / 07期
关键词
D O I
10.1103/PhysRevB.61.4844
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present experimental data on the band-structure and high-mobility transport properties of 6H and 4H-SiC epitaxial films based on optically detected cyclotron resonance investigations. From the orientational dependence of the electron effective mass in 6H-SiC we obtain direct evidence for the camels back nature of the conduction band between the M and L points. The broadening of the resonance signal in 4H-SIC as a function of temperature is used to extract information on electron mobilities and to conclude on the role of the different scattering mechanisms. Under high microwave powers an enhancement of the electron effective mass is found which is explained by a coupling of the electrons with longitudinal optical phonons.
引用
收藏
页码:4844 / 4849
页数:6
相关论文
共 27 条
[1]  
ASHKINADZE BM, 1990, SOV PHYS SEMICOND+, V24, P555
[2]  
BROOKS H, 1951, PHYS REV, V83, P879
[3]  
Chen WM, 1997, PHYS STATUS SOLIDI A, V162, P79, DOI 10.1002/1521-396X(199707)162:1<79::AID-PSSA79>3.0.CO
[4]  
2-D
[5]   EXCITON RECOMBINATION RADIATION AND PHONON SPECTRUM OF 6H SIC [J].
CHOYKE, WJ ;
PATRICK, L .
PHYSICAL REVIEW, 1962, 127 (06) :1868-&
[6]  
COLWELL PJ, 1971, PHYS REV B, V2, P10909
[7]   MICROWAVE THERMAL MODULATION OF PHOTOLUMINESCENCE IN III-V SEMICONDUCTORS [J].
DELONG, MC ;
VIOHL, I ;
OHLSEN, WD ;
TAYLOR, PC ;
OLSON, JM .
PHYSICAL REVIEW B, 1991, 43 (02) :1510-1519
[8]   OPTICAL-DETECTION OF CYCLOTRON-RESONANCE FOR CHARACTERIZATION OF RECOMBINATION PROCESSES IN SEMICONDUCTORS [J].
GODLEWSKI, M ;
CHEN, WM ;
MONEMAR, B .
CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1994, 19 (04) :241-301
[9]   ELECTRONIC-PROPERTIES OF CUBIC AND HEXAGONAL SIC POLYTYPES FROM AB-INITIO CALCULATIONS [J].
KACKELL, P ;
WENZIEN, B ;
BECHSTEDT, F .
PHYSICAL REVIEW B, 1994, 50 (15) :10761-10768
[10]   Direct observation of conduction-band structure of 4H- and 6H-SiC using ballistic electron emission microscopy [J].
Kaczer, B ;
Im, HJ ;
Pelz, JP ;
Chen, J ;
Choyke, WJ .
PHYSICAL REVIEW B, 1998, 57 (07) :4027-4032