Scanning electrochemical microscopy with shear force feedback -: Investigation of the lateral resolution of different experimental configurations

被引：45

作者：

Büchler, M ^{[1
]}

Kelley, SC ^{[1
]}

Smyrl, WH ^{[1
]}

机构：

[1] Univ Minnesota, Corros Res Ctr, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA

来源：

ELECTROCHEMICAL AND SOLID STATE LETTERS | 2000年 / 3卷 / 01期

关键词：

D O I：

10.1149/1.1390950

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The combination of shear force feedback based on the tuning fork technique with scanning electrochemical microscopy (SECM) allows the concurrent acquisition of an SECM image and sample topography. The technique is used for the detection of electroactive sites on a microgrid electrode in 0.1 M ferricyanide solution. The small separation distance between sample and probe allows the introduction of a new contrast technique based on the modulation of the concentration of ferrocyanide at the probe. This approach is expected to allow the versatile use of SECM even in open-circuit experiments. (C) 1999 The Electrochemical Society. S1099-0062(99)08-023-2. All rights reserved.

引用

页码：35 / 38

页数：4

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