The physical significance of the mixed dynamic form factor

被引：50

作者：

Schattschneider, P

Nelhiebel, M

Souchay, H

Jouffrey, B

机构：

[1] Vienna Univ Technol, Inst Angew & Tech Phys, A-1040 Vienna, Austria

[2] Ecole Cent Paris, Lab Mecan Sols Struct & Mat, CNRS, UMR 8579, F-92295 Chatenay Malabry, France

来源：

MICRON | 2000年 / 31卷 / 04期

关键词：

electron energy-loss spectroscopy (EELS); density matrix; inelastic scattering; dynamic form factor;

D O I：

10.1016/S0968-4328(99)00112-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We show that the mixed dynamic form factor for inelastic scattering of fast electrons in crystals is closely related to the density matrix of the probe electron and to that of the scatterer. With this insight it is possible to calculate both energy filtered diffraction patterns and energy spectroscopic high-resolution images. As an example we discuss the Si-K and -L edges. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：333 / 345

页数：13

共 48 条

[1] ELECTRON-ENERGY LOSS SPECTROSCOPY IN A CRYSTALLINE ENVIRONMENT USING INNER-SHELL IONIZATION [J].