Resonant field ionization: A new imaging mechanism in the field ion microscope

被引:24
作者
Kreuzer, HJ
Wang, RLC
机构
来源
ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS | 1997年 / 202卷
关键词
density functional calculations; oxygen; field ionization; field ion microscopy;
D O I
10.1524/zpch.1997.202.Part_1_2.127
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The high image brightness of oxygen-covered Pt and Pd surfaces obtained in the field ion microscope with molecular oxygen as the imaging gas is explained as due to resonant field ionization. In contrast, clean and CO-covered field emitter surfaces have so far not been imaged with molecular oxygen. We present extensive calculations of field-induced adsorption based on density functional theory in the form of potential energy curves and contour plots of wave functions to make the argument for resonant field ionization. Some suggestions are made for which imaging,eases and surfaces resonant field ionization may be observed.
引用
收藏
页码:127 / 138
页数:12
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