A capacitive sensing integrated circuit for detection of micromotor critical angles

被引:10
作者
Garverick, SL
Nagy, ML
Rao, NK
Hartsfield, DK
Purushotham, A
机构
[1] Dept. of Elec. Eng. and Appl. Phys., Case Western Reserve Laboratory, Cleveland
[2] Crystal Semiconductor Corporation, Austin
[3] Channel Products Inc., Chesterland
[4] Intel Corporation, Santa Clara
[5] Massachusetts Inst. of Technology, Cambridge, MA
[6] General Electric Company, Corporate Reseach and Development
[7] Dept. of Elec. Eng. and Appl. Phys., Case Western Reserve University, Cleveland, OH
[8] Tau Beta Pi, Kappa Nu
[9] University of Detroit, MI
[10] Case Western Reserve University, Cleveland, OH
[11] Analytical Engineering, North Olmsted, OH
[12] Bradford Engineering, Putte
[13] Mixed Signal IC Design Group, Case Western Reserve University, Cleveland, OH
[14] Birla Inst. of Technol. and Science, Pilani
[15] Crystal Semiconductor Inc., Austin, TX
[16] Indian Institute of Technology, Madras
[17] National Aeronautical Laboratory, Bangalore
[18] Intel Corparation, Santa Clara, CA
基金
美国国家科学基金会;
关键词
capacitance measurement; charge measurement; CMOS analog integrated circuits; micromotors; noise measurement; switched capacitor circuits;
D O I
10.1109/4.553172
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The theory, design, and measured performance of an integrated circuit which enables closed-loop control of electrostatic micromotors is presented. The micromotor control integrated circuit (MCIC) consists of low-noise sense electronics designed to detect critical rotor angles to a resolution of 0.5 degrees (0.05 fF) at a 1-MHz sampling rate, and control logic which cycles the micromotor drive state during continuous rotation to maintain maximum torque, independent of loading, Noise due to MOSFET switches and amplifiers in the analog section is modeled and shown to be 32 mu V referred to the system input, i.e., about half the desired switching resolution. The MCIC was fabricated using a 2-mu m, n-well CMOS process and functions as expected, The noise probability density function was measured using MCIC's digital output for different values of input-to-ground capacitance in order to verify the noise model, Good agreement with theory was observed, although the comparator exhibited some offset and hysteresis.
引用
收藏
页码:23 / 30
页数:8
相关论文
共 21 条
[1]   IMAGING DEVICES USING CHARGE-COUPLED CONCEPT [J].
BARBE, DF .
PROCEEDINGS OF THE IEEE, 1975, 63 (01) :38-67
[2]   ELECTRIC MICROMOTOR DYNAMICS [J].
BART, SF ;
MEHREGANY, M ;
TAVROW, LS ;
LANG, JH ;
SENTURIA, SD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (03) :566-575
[3]   LOW-NOISE, LOW-DISTORTION CMOS AM WIDE-BAND AMPLIFIERS MATCHING A CAPACITIVE SOURCE [J].
CHANG, ZY ;
SANSEN, WMC .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (03) :833-840
[4]  
DHULER VR, 1992, IEEE SOL STAT SENS A, P10
[5]   IC-PROCESSED ELECTROSTATIC MICROMOTORS [J].
FAN, LS ;
TAI, YC ;
MULLER, RS .
SENSORS AND ACTUATORS, 1989, 20 (1-2) :41-47
[6]  
FROBERG CE, 1969, INTRO NUMERICAL ANAL, pCH9
[7]   A 32-CHANNEL CHARGE READOUT IC FOR PROGRAMMABLE, NONLINEAR QUANTIZATION OF MULTICHANNEL DETECTOR DATA [J].
GARVERICK, SL ;
SKRENES, L ;
BAERTSCH, RD .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1995, 30 (05) :533-541
[8]  
GRAY P, 1993, ANAL DESIGN ANALOG I, P465
[9]  
HOLLOWAY P, 1992, ISSCC DIG TECH PAPER, P176
[10]  
LEE YS, 1978, IEEE J SOLID-ST CIRC, V13, P294