Perpendicular magnetoresistance in Co/Cu multilayered nanowires

被引：55

作者：

Piraux, L

Dubois, S

Marchal, C

Beuken, JM

Filipozzi, L

Despres, JF

Ounadjela, K

Fert, A

机构：

[1] INST PHYS & CHIM MAT STRASBOURG,F-67037 STRASBOURG,FRANCE

[2] UNIV PARIS 11,F-91405 ORSAY,FRANCE

[3] THOMSON CSF,CENT RECH LAB,F-91404 ORSAY,FRANCE

[4] CNRS,UNITE MIXTE RECH,F-91404 ORSAY,FRANCE

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1996年 / 156卷 / 1-3期

关键词：

D O I：

10.1016/0304-8853(95)00882-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have carried out magnetoresistance measurements in the CPP (current perpendicular to the planes) geometry of electrodeposited Co/Cu multilayered nanowires with Cu and Co layer thicknesses varying over wide ranges. The data are compared with the results of the Valet-Fert model for perpendicular transport. The observed behaviour agrees with the corresponding predictions in various limits of the layers thicknesses. The interface and bulk spin-dependent scattering parameters as well as the spin diffusion lengths in the nonmagnetic and ferromagnetic layers are extracted from this analysis.

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页码：317 / 320

页数：4

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