Highly charged ions produced in a warm electron beam ion trap

被引:12
作者
Ovsyannikov, VP
Zschornack, G
Grossmann, F
Landgraf, S
Ullmann, F
Werner, T
机构
[1] Tech Univ Dresden, Dept Nucl & Particle Phys, D-01069 Dresden, Germany
[2] Leybold Syst & Serv GmbH, D-01109 Dresden, Germany
[3] LHE, Joint Nucl Res Inst, Dubna, Russia
关键词
D O I
10.1063/1.1150262
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A compact electron beam ion trap (WEBIT) working at room temperature without any cryogenic components is described and experimentally investigated. The trap design is based on permanent magnet technology. For the formation of the electron beam a Pierce electron gun equipped with a cathode of high emissivity is used. The ion trap is created by a compressed electron beam passing through a drift tube system consisting of three sections with corresponding electrical trap potentials. X-ray spectra measured with a Si(Li) semiconductor detector indicate the production of Kr34+, Xe44+, Ce48+, Ir64+, and Hg66+ ions. (C) 2000 American Institute of Physics. [S0034-6748(00)52402-2].
引用
收藏
页码:690 / 692
页数:3
相关论文
共 12 条
[1]  
[Anonymous], 1996, ELECT CYCLOTRON RESO
[2]  
DONETS ED, 1969, B OIPOTZ, V23, P65
[3]   A warm electron beam ion trap: The Micro-EBIT [J].
Khodja, H ;
Briand, JP .
PHYSICA SCRIPTA, 1997, T71 :113-116
[4]   A generation of unconventional electron beam ion sources [J].
Kleinod, M ;
Becker, R ;
Bongers, H ;
Weidenmuller, M ;
Zipfel, B ;
Donets, ED .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (03) :986-988
[5]   Status of the development of electron beam ion sources at Frankfurt [J].
Kleinod, M ;
Becker, R ;
Holtermann, H ;
Mucke, M ;
Rao, R ;
Weidenmuller, M ;
Zipfel, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02) :718-720
[6]   THE ELECTRON-BEAM ION TRAP - A NEW INSTRUMENT FOR ATOMIC PHYSICS MEASUREMENTS [J].
LEVINE, MA ;
MARRS, RE ;
HENDERSON, JR ;
KNAPP, DA ;
SCHNEIDER, MB .
PHYSICA SCRIPTA, 1988, T22 :157-163
[7]   The present status of the Tokyo electron beam ion trap [J].
Nakamura, N ;
Asada, J ;
Currell, FJ ;
Fukami, T ;
Hirayama, T ;
Kato, D ;
Motohashi, K ;
Nojikawa, E ;
Ohtani, S ;
Okazaki, K ;
Sakurai, M ;
Shimizu, H ;
Tada, N ;
Tsurubuchi, S ;
Watanabe, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02) :694-696
[8]   First investigations of a warm electron beam ion trap for the production of highly charged ions [J].
Ovsyannikov, VP ;
Zschornack, G .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (06) :2646-2651
[9]  
OVSYANNIKOV VP, 1999, 20 ARB EN AT STOSS E, P102
[10]  
Schmieder R. W., 1993, AIP Conference Proceedings, P675, DOI 10.1063/1.43641