Piezoelectric and ferroelectric properties of 1-μm-thick lead zirconate titanate film fabricated by a double-spin-coating process

被引:50
作者
Park, GT [1 ]
Choi, JJ [1 ]
Park, CS [1 ]
Lee, JW [1 ]
Kim, HE [1 ]
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
关键词
D O I
10.1063/1.1794354
中图分类号
O59 [应用物理学];
学科分类号
摘要
Lead zirconate titanate (PZT) films were deposited on platinized silicon substrates by spin coating using PZT sols containing polyvinylpyrrolidone (PVP) as an additive. Single-layered 1-mum-thick PZT films with 60/40 composition were fabricated using two successive spin coatings followed by a single heat treatment step. The crack formation was effectively suppressed by the presence of nanosized pores which were generated during the heat treatment. The film has a preferred orientation corresponding to the (100) crystallographic direction. The ferroelectric and piezoelectric properties of the specimen were comparable to those of a film with same composition and thickness but prepared by the conventional sol-gel procedure. (C) 2004 American Institute of Physics.
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页码:2322 / 2324
页数:3
相关论文
共 14 条
[1]   ORIENTATION OF RAPID THERMALLY ANNEALED LEAD-ZIRCONATE-TITANATE THIN-FILMS ON (111) PT SUBSTRATES [J].
BROOKS, KG ;
REANEY, IM ;
KLISSURSKA, R ;
HUANG, Y ;
BURSILL, L ;
SETTER, N .
JOURNAL OF MATERIALS RESEARCH, 1994, 9 (10) :2540-2553
[2]  
Budd K. D., 1985, British Ceramic Proceedings, P107
[3]  
CHEN KC, 1990, MATER RES SOC SYMP P, V180, P663, DOI 10.1557/PROC-180-663
[4]   TEMPERATURE-TIME TEXTURE TRANSITION OF PB(ZR1-XTIX)O-3 THIN-FILMS .1. ROLE OF PB-RICH INTERMEDIATE PHASES [J].
CHEN, SY ;
CHEN, IW .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1994, 77 (09) :2332-2336
[5]   Crystal orientation dependence of piezoelectric properties in lead zirconate titanate: Theoretical expectation for thin films [J].
Du, XH ;
Belegundu, U ;
Uchino, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (9A) :5580-5587
[6]   Crystal orientation dependence of piezoelectric properties of lead zirconate titanate near the morphotropic phase boundary [J].
Du, XH ;
Zheng, JH ;
Belegundu, U ;
Uchino, K .
APPLIED PHYSICS LETTERS, 1998, 72 (19) :2421-2423
[7]   Highly oriented lead zirconium titanate thin films: Growth, control of texture, and its effect on dielectric properties [J].
Kalpat, S ;
Uchino, K .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (06) :2703-2710
[8]   Evaluation of Pb(Zr,Ti)O3 films derived from propylene-glycol-based sol-gel solutions [J].
Maki, K ;
Soyama, N ;
Mori, S ;
Ogi, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (9B) :5421-5425
[9]   Measurement of piezoelectric coefficients of lead zirconate titanate thin films by strain-monitoring pneumatic loading method [J].
Park, GT ;
Choi, JJ ;
Ryu, J ;
Fan, HQ ;
Kim, HE .
APPLIED PHYSICS LETTERS, 2002, 80 (24) :4606-4608
[10]   Ferroelectric thin films in microelectromechanical systems applications [J].
Polla, DL ;
Francis, LF .
MRS BULLETIN, 1996, 21 (07) :59-65