Measurement of piezoelectric coefficients of lead zirconate titanate thin films by strain-monitoring pneumatic loading method

被引:55
作者
Park, GT [1 ]
Choi, JJ [1 ]
Ryu, J [1 ]
Fan, HQ [1 ]
Kim, HE [1 ]
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
关键词
D O I
10.1063/1.1487901
中图分类号
O59 [应用物理学];
学科分类号
摘要
A method to simultaneously measure the longitudinal (d(33)) and transverse (d(31)) piezoelectric coefficients of a lead zirconate titanate (PZT) thin film was developed. This system was based on the pneumatic loading method but was modified to monitor the radial strain when a pressurized gas was introduced into the chamber. The results of the bulk piezoelectric material measured by this system coincided with that measured by both the Berlincourt method and the resonance method. The effective d(33) and the real d(31) of the PZT thin film fabricated by the sol-gel multiple coating method, and poled at 300 kV/cm were 125 and -60 pC/N, respectively. The real d(33) estimated upon considering the constraints by the silicon substrate was 180 pC/N. (C) 2002 American Institute of Physics.
引用
收藏
页码:4606 / 4608
页数:3
相关论文
共 14 条
[1]  
[Anonymous], IEEE STAND PIEZ
[2]   CALCULATED ELASTIC-CONSTANTS FOR STRESS PROBLEMS ASSOCIATED WITH SEMICONDUCTOR DEVICES [J].
BRANTLEY, WA .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (01) :534-535
[3]   Design and simulation of an implantable medical drug delivery system using microelectromechanical systems technology [J].
Cao, L ;
Mantell, S ;
Polla, D .
SENSORS AND ACTUATORS A-PHYSICAL, 2001, 94 (1-2) :117-125
[4]   Piezoelectric measurements with atomic force microscopy [J].
Christman, JA ;
Woolcott, RR ;
Kingon, AI ;
Nemanich, RJ .
APPLIED PHYSICS LETTERS, 1998, 73 (26) :3851-3853
[5]   AN EXPERIMENTAL 512-BIT NONVOLATILE MEMORY WITH FERROELECTRIC STORAGE CELL [J].
EVANS, JT ;
WOMACK, R .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1988, 23 (05) :1171-1175
[6]  
Jaffe B., 1971, PIEZOELECTRIC CERAMI, P135
[7]   Interferometric measurements of electric field-induced displacements in piezoelectric thin films [J].
Kholkin, AL ;
Wutchrich, C ;
Taylor, DV ;
Setter, N .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (05) :1935-1941
[8]   MEASUREMENT OF PIEZOELECTRIC COEFFICIENTS OF FERROELECTRIC THIN-FILMS [J].
LEFKI, K ;
DORMANS, GJM .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (03) :1764-1767
[9]   ELECTRICAL CHARACTERISTICS OF FERROELECTRIC PZT THIN-FILMS FOR DRAM APPLICATIONS [J].
MOAZZAMI, R ;
HU, CM ;
SHEPHERD, WH .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (09) :2044-2049
[10]   FABRICATION AND CHARACTERIZATION OF PZT THIN-FILM VIBRATORS FOR MICROMOTORS [J].
MURALT, P ;
KOHLI, M ;
MAEDER, T ;
KHOLKIN, A ;
BROOKS, K ;
SETTER, N ;
LUTHIER, R .
SENSORS AND ACTUATORS A-PHYSICAL, 1995, 48 (02) :157-165