Fault management of multicell converters

被引：99

作者：

Turpin, C ^{[1
]}

Baudesson, P

Richardeau, F

Forest, F

Meynard, TA

机构：

[1] Inst Natl Polytech Toulouse, CNRS, Lab Electrotech & Elect Ind, F-31071 Toulouse 7, France

[2] Univ Montpellier 2, Univ Sci & Tech Languedoc, Lab Electrotech Montpellier, F-34095 Montpellier 5, France

来源：

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | 2002年 / 49卷 / 05期

关键词：

fault currents; fault detection; fault location; fault tolerance; insulated gate bipolar transistors; multilevel systems; power electronics; power systems harmonics;

D O I：

10.1109/TIE.2002.803196

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Component counts and oversimplified reliability rules may lead to the conclusion that multilevel converters are less safe than two-level converters, just because they use more components. A better approach might be to consider that they use a different arrangement of components and also that the consequence of faults may be very different. This paper is focused on the study of the consequences of faults in hard-switching and soft-switching multicell converters. Solutions to minimize the consequences of major faults are described.

引用

页码：988 / 997

页数：10