共 56 条
- [2] ADAMS H, UNPUB ACTA CRYSTALLO
- [3] STRUCTURAL CHARACTERIZATION OF MULTILAYER METAL PHOSPHONATE FILM ON SILICON USING ANGULAR-DEPENDENT X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 1608 - 1613
- [7] ATIS L, 1988, J ORG CHEM, V53, P5475
- [10] BILL CM, 1994, J AM CHEM SOC, V116, P8374