Low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer-scale objects: Application to carbon nanotubes

We have developed a simple and reliable technique for two-terminal transport measurements of free-standing wire-like objects. The method is based on the low-energy electron point source microscope. The field emission tip of the microscope is used as a movable electrode to make a well-defined local electrical contact on a controlled place of a nanometer-size object. This allows transport measurements of the object to be conducted. The technique was applied to carbon nanotube ropes. (C) 2002 American Vacuum Society.