Growth and characterisation of carbon nanostructures obtained by MPACVD system using CH4/CO2 gas mixture

被引:29
作者
Chatei, H.
Belmahi, M. [1 ]
Assouar, M. B.
Le Brizoual, L.
Bourson, P.
Bougdira, J.
机构
[1] Univ Nancy 1, CNRS, UMR 7040, Lab Phys Milieux Ionises & Applicat, F-54506 Vandoeuvre Les Nancy, France
[2] Univ Mohammed 1, Fac Sci, Lab Phys Theor & Part, Oujda 60000, Morocco
[3] Univ P Verlaine Metz, UMR 7132, Lab Mat Opt Photon & Syst, F-57070 Metz, France
关键词
carbon nanostructures; plasma CVD; CH4/CO2; vibratioanl properties characterization;
D O I
10.1016/j.diamond.2005.10.025
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study. CH4/CO2 gas mixture in Microwave Plasma Assisted Chemical Vapour Deposition (MPACVD) system is used for the growth of different Carbon Nanostructures (CNSs). Fe-SiO deposited on Si(100) in which Fe particles are embedded in a 50 nm SiO film were used as the catalyst. By varying the amount of CH4 to CO2, We have observed that it is possible to obtain a variety of CNSs including Carbon Nanotips (CNTPs) at 45% of CH4, bundle of Multi-wall Carbon Nanotubes (MWCNTs) at 48-50% of CH4, and Carbon Nanowalls (CNWs) at 53% of CH4 at a temperature around 900 degrees C. The diagnostic of the used plasma discharge is carried out by optical emission spectroscopy (OES). It shows the presence of atomic hydrogen H, CH, C-2, CO and OH radicals. Scanning electron microscopy observations show that the obtained CNTPs are not perpendicular to the surface, due to the no applied polarisation to the substrate holder during the growth. The top of the CNTPs size and length are respectively around 10 nm and 3 pm. Raman spectroscopy measurements exhibit a variation in the D and G lines intensity when varying the CH4 amount in the gas mixture. Correlations between OES characterisations and microstructural analyses are established. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:1041 / 1046
页数:6
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