Analysis of ion dynamics and peak shapes for delayed extraction time-of-flight mass spectrometers

被引：6

作者：

Collado, VM

Ponciano, CR

Fernandez-Lima, FA

da Silveira, EF

机构：

[1] Pontificia Univ Catolica Rio de Janeiro, Dept Fis, BR-22452970 Rio De Janeiro, Brazil

[2] Inst Super Ciencias & Tecnol Nucl, Havana, Cuba

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2004年 / 75卷 / 06期

关键词：

D O I：

10.1063/1.1711161

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The dependence of time-of-flight (TOF) peak shapes on time-dependent extraction electric fields is studied theoretically. Conditions for time focusing are analyzed both analytically and numerically for double-acceleration-region TOF spectrometers. Expressions for the spectrometer mass resolution and for the critical delay time are deduced. Effects due to a leakage field in the first acceleration region are shown to be relevant under certain conditions. TOF peak shape simulations for the delayed extraction method are performed for emitted ions presenting a Maxwellian initial energy distribution. Calculations are compared to experimental results of Cs+ emission due to CsI laser ablation. (C) 2004 American Institute of Physics.

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收藏

页码：2163 / 2170

页数：8

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