Femtosecond laser machining of fluidic microchannels for miniaturized bioanalytical systems

被引:12
作者
Ben-Yakar, A
Byer, RL
机构
来源
PHOTON PROCESSING IN MICROELECTRONICS AND PHOTONICS | 2002年 / 4637卷
关键词
ultrafast lasers; micromachining; borosilicate glass; damage threshold; ablation rate; optical penetration depth; micro-channels; microfluidics;
D O I
10.1117/12.470625
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Femtoseoond laser ablation of borosilicate (Borofloat(TM)) glass has been studied to machine fluidic micro-channel geometries (high aspect ratio and variable depth) not possible through traditional micro-lithographic techniques. Utilizing a 1 kHz repetition rate femtosecond laser system (Positive Light Spitfire) and a long-working distance 5x objective lens, groove patterns 10 mum wide and as deep as 30 mum have been produced. The experiments were performed in air and the samples were cleaned after the ablation with sodium hydroxide dissolved in water to remove the debris. The substrates were mounted on a computer controlled x-y translation stage. The quality of the micro-channels showed dependency on the scanning speed of the sample. The surrounding area of the channels was smooth at scanning rates greater than 400 mum/s and smaller than 10 mum/s. Whereas, cracks appeared around the channels at scanning rates between 200 to 50 mum/s. Surface morphology is studied using optical, electron and atomic force microscopies. For a quantitative evaluation of ablation threshold and ablation rates, single-shot experiments in vacuum were performed. We found that the damage threshold for borosilicate glass is around 1.7 J/cm(2). With single pulse laser fluence of 30 J/cm(2), a 600 nm deep crater could be ablated. A ring, higher than the surface, appeared around the craters and was most probably created by adiabatic compression of glass due to the high-pressure plasma generated in the early stages of the process.
引用
收藏
页码:212 / 217
页数:6
相关论文
共 4 条
[1]   Ultrashort-pulse laser ablation of indium phosphide in air [J].
Bonse, J ;
Wrobel, JM ;
Krüger, J ;
Kautek, W .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 72 (01) :89-94
[2]   Laser ablation of dielectrics with pulse durations between 20 fs and 3 ps [J].
Kautek, W ;
Kruger, J ;
Lenzner, M ;
Sartania, S ;
Spielmann, C ;
Krausz, F .
APPLIED PHYSICS LETTERS, 1996, 69 (21) :3146-3148
[3]   Femtosecond optical breakdown in dielectrics [J].
Lenzner, M ;
Kruger, J ;
Sartania, S ;
Cheng, Z ;
Spielmann, C ;
Mourou, G ;
Kautek, W ;
Krausz, F .
PHYSICAL REVIEW LETTERS, 1998, 80 (18) :4076-4079
[4]  
PREUSS S, 1995, APPL PHYS A-MATER, V61, P33, DOI 10.1007/BF01538207