共 24 条
[2]
Atomic force microscopy and ellipsometry study of the nucleation and growth mechanism of polycrystalline silicon films on silicon dioxide
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1998, 16 (04)
:2466-2479
[3]
Bez R., 1990, International Electron Devices Meeting 1990. Technical Digest (Cat. No.90CH2865-4), P99, DOI 10.1109/IEDM.1990.237217
[4]
CAPPELLETTI P, 1998, FLASH MEMORIES
[5]
CRUPI I, 2003, IN PRESS SIL NAN WOR
[8]
DEBLAUWE J, 2000, IEDM
[10]
GEBEL T, 2000, MAT RES SOC S P, V638