Time scales of phonon-induced decoherence of semiconductor spin qubits

被引:28
作者
Mozyrsky, D
Kogan, S
Gorshkov, VN
Berman, GP
机构
[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
[2] Los Alamos Natl Lab, CNRS, Los Alamos, NM 87545 USA
[3] Clarkson Univ, Dept Phys, Potsdam, NY 13699 USA
来源
PHYSICAL REVIEW B | 2002年 / 65卷 / 24期
基金
美国国家科学基金会;
关键词
D O I
10.1103/PhysRevB.65.245213
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Decoherence of a shallow donor electron spin in Si and Ge caused by electron-lattice interaction is studied. We find that there are two time scales associated with the evolution of the electron spin density matrix: the fast, but incomplete decay due to the interaction with nonresonant phonons, followed by slow relaxation resulting from spin flips accompanied by resonant phonon emission. We estimate both time scales, as well as the magnitude of the initial drop of coherence for P donor in Si and Ge, and argue that the approach used in the paper is suitable for evaluation of decoherence for a general class of localized spin states in semiconductors.
引用
收藏
页码:1 / 4
页数:4
相关论文
共 32 条
[1]  
BERMAN GP, QUANTPH0101035
[2]  
Blum K., 2012, DENSITY MATRIX THEOR
[3]   QUANTUM COMPUTATION [J].
DIVINCENZO, DP .
SCIENCE, 1995, 270 (5234) :255-261
[4]   ELECTRON SPIN RESONANCE EXPERIMENTS ON DONORS IN SILICON .2. ELECTRON SPIN RELAXATION EFFECTS [J].
FEHER, G ;
GERE, EA .
PHYSICAL REVIEW, 1959, 114 (05) :1245-1256
[5]   Decoherence in ion trap quantum computers [J].
Garg, A .
PHYSICAL REVIEW LETTERS, 1996, 77 (05) :964-967
[6]   MICROWAVE SPIN ECHOES FROM DONOR ELECTRONS IN SILICON [J].
GORDON, JP ;
BOWERS, KD .
PHYSICAL REVIEW LETTERS, 1958, 1 (10) :368-370
[7]   SPIN-LATTICE RELAXATION OF SHALLOW DONOR STATES IN GE AND SI THROUGH A DIRECT PHONON PROCESS [J].
HASEGAWA, H .
PHYSICAL REVIEW, 1960, 118 (06) :1523-1534
[8]  
HONIG A, 1958, PHYS REV LETT, V1, P275
[9]   Quantum information processing using quantum dot spins and cavity QED [J].
Imamoglu, A ;
Awschalom, DD ;
Burkard, G ;
DiVincenzo, DP ;
Loss, D ;
Sherwin, M ;
Small, A .
PHYSICAL REVIEW LETTERS, 1999, 83 (20) :4204-4207
[10]   Single-spin measurement using single-electron transistors to probe two-electron systems [J].
Kane, BE ;
McAlpine, NS ;
Dzurak, AS ;
Clark, RG ;
Milburn, GJ ;
Sun, HB ;
Wiseman, H .
PHYSICAL REVIEW B, 2000, 61 (04) :2961-2972