Discussion on some voltage collapse indices

This paper discusses some voltage collapse indices with the help of bifurcation theory. Two main topics are presented: first, the identification of a well-behaved eigenvalue as a function of load increase; second a theoretical interpretation of the results. For this purpose, the center manifold theorem is employed. The tests are carried out using the IEEE-300 Bus test system. The results show that under certain considerations, the voltage collapse indices analyzed produce identical results. (C) 2000 Elsevier Science S.A. All rights reserved.