Input impedance of a coaxial line terminated with a complex gap capacitance - Numerical and experimental analysis

被引:10
作者
Obrzut, J [1 ]
Anopchenko, A [1 ]
机构
[1] Natl Inst Stand & Technol, Div Polymers, Gaithersburg, MD 20899 USA
关键词
coaxial discontinuity; dielectric materials; full-wave analysis; high-frequency electromagnetic simulation; high-frequency measurements;
D O I
10.1109/TIM.2004.830777
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A full-wave numerical analysis was performed for a coaxial line terminated with a complex gap capacitance using a finite-element high-frequency structure simulator. The scattering parameters, input impedance, and spatial distribution of the electromagnetic field have been obtained in the frequency range of 100 MHz to 19 GHz for specimens 8 to 320 mum thick, with a dielectric constant of up to 80. It was found that the residual inductance of the specimen affects the impedance characteristic of the network. The inductance-capacitance resonance is coupled with the cavity resonance. The specimen inductance is linearly dependent on the specimen thickness. At frequencies near the cavity resonance, the specimen section can be treated as a network of a transmission line with a capacitance, where the fundamental mode propagates along the diameter of the specimen. Results of the numerical analysis were verified experimentally using water as a model material with a high dielectric constant. Our closed-form formula for input impedance of the network is valid in a wider frequency range than the Jumped-element method. The results are useful in improving the accuracy of broadband dielectric measurements in the extended frequency range of thin films with high dielectric constant that are of interest to bio- and nanotechnology.
引用
收藏
页码:1197 / 1201
页数:5
相关论文
共 14 条
[1]   Equivalent circuit for coaxial discontinuities filled with dielectric materials - Frequency extension of the Marcuvitz's circuit [J].
Belhadj-Tahar, NE ;
Dubrunfaut, O ;
Fourrier-Lamer, A .
JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 2001, 15 (06) :727-743
[2]   Universal formula for frequency-dependent coaxial open-end effect [J].
Chramiec, J ;
Piotrowski, JK .
ELECTRONICS LETTERS, 1999, 35 (17) :1474-1475
[3]   Full-wave analysis of coaxial mounting structure [J].
Davidovich, MV .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1999, 47 (03) :265-270
[4]   Scattering analysis of a coaxial line terminated by a gap [J].
Eom, HJ ;
Noh, YC ;
Park, JK .
IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1998, 8 (06) :218-219
[5]  
HASTED JB, 1973, AQUEOUS DIELECTRICS, P43
[6]   FRINGING FIELD-EFFECT IN LUMPED-CAPACITANCE METHOD FOR PERMITTIVITY MEASUREMENT [J].
ISKANDER, MF ;
STUCHLY, SS .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1978, 27 (01) :107-109
[7]   FULL-WAVE ANALYSIS OF DIELECTRIC WAVE-GUIDES USING TANGENTIAL VECTOR FINITE-ELEMENTS [J].
LEE, JF ;
SUN, DK ;
CENDES, ZJ .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (08) :1262-1271
[8]   AN IMPROVED LUMPED CAPACITANCE METHOD FOR DIELECTRIC MEASUREMENT [J].
LIAN, A ;
ZHONG, W .
JOURNAL OF MATERIALS SCIENCE, 1990, 25 (10) :4349-4355
[9]  
Marcuvitz N., 1951, WAVEGUIDE HDB
[10]  
NAVARRO MS, 1991, CIRCUITS SYST, V2, P735