Changes in the interaction characteristics of polyelectrolyte complex covered silica surfaces

被引:17
作者
Estel, K [1 ]
Kramer, G [1 ]
Schmitt, FJ [1 ]
机构
[1] Inst Polymer Res Dresden, D-01005 Dresden, Germany
关键词
polyelectrolyte complex; silica surfaces; PDADMAC;
D O I
10.1016/S0927-7757(99)00337-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The adsorption of polyelectrolyte complexes, PEG, made from the cationic poly (diallyldimethylammonium) chloride (PDADMAC) and the anionic maleic acid-co-propene copolymer (MA-P) on a Si-wafer surface has been studied. The application of highly diluted colloidally dispersed PEC solutions led to the deposition of single PEC particles onto the surface of the Si-wafer. The interaction forces of the heterogeneously covered surface were monitored by direct force measurements with an atomic force microscope (AFM) in the force volume mode. On the surface of a single PEC particle drastic changes in the interaction forces were found in comparison with the unmodified Si-wafer: in all force vs, distance curves a strong increase of the adhesion was measured that can be attributed to the formation of eletrostatic bonds between the negatively charged Si3N4-tip and the cationic excess charge of the PEG. Additionally, the behavior during approach of both surfaces has been distinct: at pH 6.1 we see a long range electrostatic attraction between the tip and the PEC particle. The attraction becomes even stronger at pH 4.1, because of an increased positive net charge. Generally, a heterogeneous surface with a wide variety of interaction features can be created by the adsorption of PEC particles. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:193 / 202
页数:10
相关论文
共 29 条
[1]   STERIC AND BRIDGING FORCES BETWEEN SURFACES FEARING ADSORBED POLYMER - AN ATOMIC-FORCE MICROSCOPY STUDY [J].
BIGGS, S .
LANGMUIR, 1995, 11 (01) :156-162
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   Interactions between poly(ethylene oxide) layers adsorbed to glass surfaces probed by using a modified atomic force microscope [J].
Braithwaite, GJC ;
Howe, A ;
Luckham, PF .
LANGMUIR, 1996, 12 (17) :4224-4237
[4]   ELECTROSTATIC INTERACTION IN ATOMIC FORCE MICROSCOPY [J].
BUTT, HJ .
BIOPHYSICAL JOURNAL, 1991, 60 (04) :777-785
[5]   MEASURING SURFACE FORCES IN AQUEOUS-ELECTROLYTE SOLUTION WITH THE ATOMIC-FORCE MICROSCOPE [J].
BUTT, HJ ;
JASCHKE, M ;
DUCKER, W .
BIOELECTROCHEMISTRY AND BIOENERGETICS, 1995, 38 (01) :191-201
[6]   MEASURING LOCAL SURFACE-CHARGE DENSITIES IN ELECTROLYTE-SOLUTIONS WITH A SCANNING FORCE MICROSCOPE [J].
BUTT, HJ .
BIOPHYSICAL JOURNAL, 1992, 63 (02) :578-582
[7]   MEASURING ELECTROSTATIC, VANDERWAALS, AND HYDRATION FORCES IN ELECTROLYTE-SOLUTIONS WITH AN ATOMIC FORCE MICROSCOPE [J].
BUTT, HJ .
BIOPHYSICAL JOURNAL, 1991, 60 (06) :1438-1444
[8]   A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY [J].
CLEVELAND, JP ;
MANNE, S ;
BOCEK, D ;
HANSMA, PK .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) :403-405
[9]   DIRECT MEASUREMENT OF COLLOIDAL FORCES USING AN ATOMIC FORCE MICROSCOPE [J].
DUCKER, WA ;
SENDEN, TJ ;
PASHLEY, RM .
NATURE, 1991, 353 (6341) :239-241
[10]   QUANTIZED ADHESION DETECTED WITH THE ATOMIC FORCE MICROSCOPE [J].
HOH, JH ;
CLEVELAND, JP ;
PRATER, CB ;
REVEL, JP ;
HANSMA, PK .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1992, 114 (12) :4917-4918