Soft X-ray characterization of perpendicular recording media

被引:10
作者
Fullerton, EE
Hellwig, O
Ikeda, Y
Lengsfield, B
Takano, K
Kortright, JB
机构
[1] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
关键词
cobalt alloys; electromagnetic scattering by magnetic media; perpendicular magnetic recording; small-angle scattering; X-ray scattering;
D O I
10.1109/TMAG.2002.1017758
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Various spectroscopy, imaging, and scattering techniques exploit core-level resonances accessible in the soft X-ray energies to obtain magnetic information in thin films with elemental specificity. In this paper, we describe the emerging technique of resonant soft X-ray small-angle scattering (SAS) as a probe of magnetic and chemical variations in recording media on the nanometer scale. In particular, we characterize the grain size of a CoB-Pd multilayer media and magnetic and chemical grain sizes in perpendicular CoPtCr media.
引用
收藏
页码:1693 / 1697
页数:5
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