Measurement of double-layer forces at the polymer film/electrolyte interfaces using atomic force microscopy: Concentration and potential-dependent interactions

被引:17
作者
Wang, J
Feldberg, SW
Bard, AJ
机构
[1] Univ Texas, Dept Chem & Biochem, Austin, TX 78712 USA
[2] Brookhaven Natl Lab, Upton, NY 11973 USA
关键词
D O I
10.1021/jp026350k
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The forces between colloidal probes and several polymer films were measured by atomic force microscopy in the presence of a series of electrolyte solutions. For Nafion films using a negatively charged silica tip, a repulsive force was obtained at different concentrations of NaClO4. A similar result was obtained for an anion exchange membrane with a positively charged probe. Derjaguin-Landau-Verwey-Overbeek (DLVO) theory was employed to calculate the surface potential and hence, the surface charge. The surface charge density (similar to0.3muC/cm(2)) was independent of electrolyte concentration. The slope for plot of potential drop vs ln[c(5)] was similar to0.020 V. A theoretical treatment based on GCS theory was employed to account for the above results. For a poly,(vinylferrocene), (PVF) film, potenial-dependent force curves were obtained, which were qualitatively different from that previously reported for an electronically conducting polymer film electrode.(1).
引用
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页码:10440 / 10446
页数:7
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[41]   Direct atomic force microscopic determination of surface charge at the gold/electrolyte interface - The inadequacy of classical GCS theory in describing the double-layer charge distribution [J].
Wang, J ;
Bard, AJ .
JOURNAL OF PHYSICAL CHEMISTRY B, 2001, 105 (22) :5217-5222