Technology opportunity identification customized to the technological capability of SMEs through two-stage patent analysis

被引：65

作者：

Lee, Yongho ^{[1
]}

Kim, So Young ^{[2
]}

Song, Inseok ^{[2
]}

Park, Yongtae ^{[3
]}

Shin, Juneseuk ^{[4
]}

机构：

[1] Korea Inst Sci & Technol Informat, Dept Policy Res, Taejon 305806, South Korea

[2] Korea Inst Sci & Technol Informat, Dept Technol Opportun Anal, Seoul, South Korea

[3] Seoul Natl Univ, Dept Ind Engn, Seoul 151742, South Korea

[4] Sungkyunkwan Univ, Dept Syst Management Engn, 300 Chunchun Dong, Suwon 440746, Gyoenggi Do, South Korea

来源：

SCIENTOMETRICS | 2014年 / 100卷 / 01期

关键词：

Technology opportunity; Small and medium enterprise; Technological capability; Patent analysis; Action and object analysis; FORECASTING EMERGING TECHNOLOGIES; PRODUCT; BIBLIOMETRICS; INNOVATION; SCIENCE; TRENDS;

D O I：

10.1007/s11192-013-1216-0

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Small and medium enterprises (SMEs) have difficulties identifying appropriate technology opportunities under severe capability and resource constraints. To tackle this issue, we suggest a method for identifying technology opportunities that is customized to the existing technologies and technological capabilities of SMEs through two-stage patent analysis. An expert-based technological attribute-application table makes it possible to identify basic opportunities by multiple keyword matching. Also, non-traditional opportunities can be explored and identified by an iterative action-object analysis of patents. This two-stage patent analysis approach provides managers with a way of identifying specific technology opportunities in which their existing technologies can be utilized to the maximum extent, therefore helping them to develop technology strategies.

引用

页码：227 / 244

页数：18

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