STM excited electroluminescence of GaN microcrystals

被引:3
作者
Liebheit, A [1 ]
Schwartzkopff, M [1 ]
Radojkovic, P [1 ]
Hartmann, E [1 ]
Hechtl, E [1 ]
PetrovaKoch, V [1 ]
Koch, F [1 ]
机构
[1] TECH UNIV MUNICH,PHYS DEPT E16,D-85748 GARCHING,GERMANY
关键词
STM; GaN; luminescence;
D O I
10.1016/S0022-2313(96)00298-0
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report on a system of GaN crystallites grown onto Si substrates with and without preconditioning of the surface layer by Si implantation. Upon electronic excitation by the tip of a scanning tunneling microscope (STM)? site-dependent luminescence spectra are obtained. implying the possibility to correlate structural and optical properties at the nanometer scale. Voltage-polarity-dependent measurements lead to a simple model for the excitation mechanism.
引用
收藏
页码:994 / 996
页数:3
相关论文
共 6 条
[1]  
Eckey L, 1996, APPL PHYS LETT, V68, P415, DOI 10.1063/1.116703
[2]  
Garni B, 1996, APPL PHYS LETT, V68, P1380, DOI 10.1063/1.116086
[3]   EPITAXIAL-GROWTH AND CHARACTERIZATION OF ZINCBLENDE GALLIUM NITRIDE ON (001) SILICON [J].
LEI, T ;
MOUSTAKAS, TD ;
GRAHAM, RJ ;
HE, Y ;
BERKOWITZ, SJ .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (10) :4933-4943
[4]  
LIEBHEIT A, 1996, P 23 INT C PHYS SEM, P883
[5]   Identification of optical transitions in cubic and hexagonal GaN by spatially resolved cathodoluminescence [J].
Menniger, J ;
Jahn, U ;
Brandt, O ;
Yang, H ;
Ploog, K .
PHYSICAL REVIEW B, 1996, 53 (04) :1881-1885
[6]  
Ponce FA, 1996, APPL PHYS LETT, V68, P57, DOI 10.1063/1.116756