Introduction: Special issue on radiation damage

被引：22

作者：

Howells, Malcolm R. ^{[1
]}

Hitchcock, Adam P. ^{[2
]}

Jacobsen, Chris J. ^{[3
]}

机构：

[1] Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA USA

[2] McMaster Univ, Dept Chem, Hamilton, ON, Canada

[3] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2009年 / 170卷 / 1-3期

关键词：

X-RAY MICROSCOPY; MACROMOLECULAR CRYSTALS; BIOLOGICAL-MATERIALS; ELECTRON-MICROSCOPY; TRANSMISSION; LIMITATIONS; RESOLUTION;

D O I：

10.1016/j.elspec.2009.01.004

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：1 / 3

页数：3

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