Profiled bar transmission gratings: soft-x-ray calibration of new Kirchoff solutions

被引：20

作者：

Hettrick, MC

Cuneo, ME

Porter, JL

Ruggles, LE

Simpson, WW

Vargas, MF

Wenger, DF

机构：

[1] Hettrick Sci, Fuchu, Tokyo 1830002, Japan

[2] Sandia Natl Labs, Albuquerque, NM 87185 USA

来源：

APPLIED OPTICS | 2004年 / 43卷 / 19期

关键词：

D O I：

10.1364/AO.43.003772

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new analytical model, derived rigorously from scalar diffraction theory, accurately fits soft-x-ray measurements of symmetrical profile gold transmission gratings in all diffracted orders. The calibration system selects numerous photon energies by use of a high-resolution grazing-incidence monochromator and a de e-beam source. Fine-period free-standing gratings exhibit limited performance and require such testing to determine parameters of and select acceptable gratings for use in time-resolved (0.25 ns) spectrographs of known radiometric response. Unfolded spectra yield a Z-pinch plasma peak kTsimilar to250 eV, total radiated energy similar to900 kJ, and a pinch-driven gold-wall hohlraum Planckian kT similar to86 eV. (C) 2004 Optical Society of America.

引用

页码：3772 / 3796

页数：25

共 17 条

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