Fast deposition of a-Si:H layers and solar cells in a large-area (40x40cm2) VHF-GD reactor

被引:20
作者
Kroll, U [1 ]
Fischer, D [1 ]
Meier, J [1 ]
Sansonnens, L [1 ]
Howling, A [1 ]
Shah, A [1 ]
机构
[1] Univ Neuchatel, Inst Microtech, CH-2000 Neuchatel, Switzerland
来源
AMORPHOUS AND HETEROGENEOUS SILICON THIN FILMS: FUNDAMENTALS TO DEVICES-1999 | 1999年 / 557卷
关键词
D O I
10.1557/PROC-557-121
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Large-area deposition of hydrogenated amorphous silicon has been investigated in a single-chamber industrial reactor with electrode dimensions of 40x40 cm(2) in the plasma excitation frequency range of 60 to 120 MHz. The film thickness uniformity, analyzed by a light interferometry technique and a step profiler, has been compared with 2-dimensional interelectrode voltage measurements and calculations. The frequency of 80 MHz has been found to be a good compromise between the gain in deposition rate and the homogeneity requirements necessary for a-Si:H solar cells. Under these conditions and while using hydrogen dilution high deposition rates of 6-7 Angstrom/s with a film uniformity of +/-5% over a usable substrate size of 30x30 cm(2) have been obtained. In the same single-chamber deposition system at 80 MHz, 0.4 mu m thick single-junction a-Si:H solar cells with high performance were fabricated in a total process time of 16 minutes applying a continuous deposition process. Spectral response measurements indicate a minor boron contamination of the i-layer. Initial cell efficiencies of 7.1 % could be achieved for such a fast grown a-Si:H solar cell.
引用
收藏
页码:121 / 126
页数:6
相关论文
共 11 条
[1]   INFLUENCE OF PLASMA EXCITATION-FREQUENCY FOR ALPHA-SI-H THIN-FILM DEPOSITION [J].
CURTINS, H ;
WYRSCH, N ;
FAVRE, M ;
SHAH, AV .
PLASMA CHEMISTRY AND PLASMA PROCESSING, 1987, 7 (03) :267-273
[2]  
FISCHER D, 1994, THESIS U NEUCHATEL
[3]   ANALYSIS OF HIGH-RATE A-SI-H DEPOSITION IN A VHF PLASMA [J].
HEINTZE, M ;
ZEDLITZ, R ;
BAUER, GH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1993, 26 (10) :1781-1786
[4]   FREQUENCY-EFFECTS IN SILANE PLASMAS FOR PLASMA ENHANCED CHEMICAL VAPOR-DEPOSITION [J].
HOWLING, AA ;
DORIER, JL ;
HOLLENSTEIN, C ;
KROLL, U ;
FINGER, F .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1992, 10 (04) :1080-1085
[5]  
KUSKE J, 1995, P MAT RES SOC S, V377, P27
[6]  
MEILING H, 1996, P 25 IEEE PHOT SPEC, P1153
[7]  
MEOT J, COMMUNICATION
[8]   A voltage uniformity study in large-area reactors for RF plasma deposition [J].
Sansonnens, L ;
Pletzer, A ;
Magni, D ;
Howling, AA ;
Hollenstein, C ;
Schmitt, JPM .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 1997, 6 (02) :170-178
[9]   Large area deposition of amorphous and microcrystalline silicon by very high frequency plasma [J].
Sansonnens, L ;
Howling, AA ;
Hollenstein, C .
AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 1998, 507 :541-546
[10]  
SANSONNENS L, 1995, P 13 EC PHOT SOL EN, P319