共 19 条
Influence of temperature and drive current on degradation mechanisms in organic light-emitting diodes
被引:97
作者:

Ishii, M
论文数: 0 引用数: 0
h-index: 0
机构:
Toyota Cent Res & Dev Labs Inc, Aichi 4801192, Japan Toyota Cent Res & Dev Labs Inc, Aichi 4801192, Japan

Taga, Y
论文数: 0 引用数: 0
h-index: 0
机构:
Toyota Cent Res & Dev Labs Inc, Aichi 4801192, Japan Toyota Cent Res & Dev Labs Inc, Aichi 4801192, Japan
机构:
[1] Toyota Cent Res & Dev Labs Inc, Aichi 4801192, Japan
关键词:
D O I:
10.1063/1.1476704
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We measured luminance decay and half life for green organic light-emitting diodes composed of materials with high glass transition temperature. The devices were driven at dc, constant current density ranging from 3.8 to 130 mA/cm(2) at 25, 85, and 120 degreesC. The shapes of the luminance decay curves were compared by redrawing the curves on a time scale normalized by each half life. Temperature and drive current shortened the half life. However, the normalized decay curve of the device driven at 120 degreesC had the same shape as that of the device driven at 25 degreesC. Drive current also left the shape of the decay curves unchanged. Therefore, we conclude that the temperature and drive current do not change the relative contribution of multiple degradation mechanisms. (C) 2002 American Institute of Physics.
引用
收藏
页码:3430 / 3432
页数:3
相关论文
共 19 条
[1]
Degradation mechanism of small molecule-based organic light-emitting devices
[J].
Aziz, H
;
Popovic, ZD
;
Hu, NX
;
Hor, AM
;
Xu, G
.
SCIENCE,
1999, 283 (5409)
:1900-1902

Aziz, H
论文数: 0 引用数: 0
h-index: 0
机构: Xerox Res Ctr Canada Ltd, Mississauga, ON L5K 2L1, Canada

Popovic, ZD
论文数: 0 引用数: 0
h-index: 0
机构: Xerox Res Ctr Canada Ltd, Mississauga, ON L5K 2L1, Canada

Hu, NX
论文数: 0 引用数: 0
h-index: 0
机构: Xerox Res Ctr Canada Ltd, Mississauga, ON L5K 2L1, Canada

Hor, AM
论文数: 0 引用数: 0
h-index: 0
机构: Xerox Res Ctr Canada Ltd, Mississauga, ON L5K 2L1, Canada

Xu, G
论文数: 0 引用数: 0
h-index: 0
机构: Xerox Res Ctr Canada Ltd, Mississauga, ON L5K 2L1, Canada
[2]
RELIABILITY AND DEGRADATION OF ORGANIC LIGHT-EMITTING DEVICES
[J].
BURROWS, PE
;
BULOVIC, V
;
FORREST, SR
;
SAPOCHAK, LS
;
MCCARTY, DM
;
THOMPSON, ME
.
APPLIED PHYSICS LETTERS,
1994, 65 (23)
:2922-2924

BURROWS, PE
论文数: 0 引用数: 0
h-index: 0
机构:
PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544 PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544

BULOVIC, V
论文数: 0 引用数: 0
h-index: 0
机构:
PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544 PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544

FORREST, SR
论文数: 0 引用数: 0
h-index: 0
机构:
PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544 PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544

SAPOCHAK, LS
论文数: 0 引用数: 0
h-index: 0
机构:
PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544 PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544

MCCARTY, DM
论文数: 0 引用数: 0
h-index: 0
机构:
PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544 PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544

THOMPSON, ME
论文数: 0 引用数: 0
h-index: 0
机构:
PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544 PRINCETON UNIV,ADV TECHNOL CTR PHOTON & OPTOELECTR,DEPT CHEM,PRINCETON,NJ 08544
[3]
In situ characterization of the oxidative degradation of a polymeric light emitting device
[J].
Cumpston, B.H.
;
Parker, I.D.
;
Jensen, K.F.
. 1997, American Inst of Physics, Woodbury, NY, United States (81)

Cumpston, B.H.
论文数: 0 引用数: 0
h-index: 0
机构:
Massachusetts Inst of Technology, Cambridge, United States Massachusetts Inst of Technology, Cambridge, United States

Parker, I.D.
论文数: 0 引用数: 0
h-index: 0
机构:
Massachusetts Inst of Technology, Cambridge, United States Massachusetts Inst of Technology, Cambridge, United States

Jensen, K.F.
论文数: 0 引用数: 0
h-index: 0
机构:
Massachusetts Inst of Technology, Cambridge, United States Massachusetts Inst of Technology, Cambridge, United States
[4]
Thermally induced failure mechanisms of organic light emitting device structures probed by X-ray specular reflectivity
[J].
Fenter, P
;
Schreiber, F
;
Bulovic, V
;
Forrest, SR
.
CHEMICAL PHYSICS LETTERS,
1997, 277 (5-6)
:521-526

Fenter, P
论文数: 0 引用数: 0
h-index: 0
机构: PRINCETON UNIV,PRINCETON MAT INST,PRINCETON,NJ 08544

Schreiber, F
论文数: 0 引用数: 0
h-index: 0
机构: PRINCETON UNIV,PRINCETON MAT INST,PRINCETON,NJ 08544

Bulovic, V
论文数: 0 引用数: 0
h-index: 0
机构: PRINCETON UNIV,PRINCETON MAT INST,PRINCETON,NJ 08544

Forrest, SR
论文数: 0 引用数: 0
h-index: 0
机构: PRINCETON UNIV,PRINCETON MAT INST,PRINCETON,NJ 08544
[5]
Electrode interface effects on indium-tin-oxide polymer/metal light emitting diodes
[J].
Gautier, E
;
Lorin, A
;
Nunzi, JM
;
Schalchli, A
;
Benattar, JJ
;
Vital, D
.
APPLIED PHYSICS LETTERS,
1996, 69 (08)
:1071-1073

Gautier, E
论文数: 0 引用数: 0
h-index: 0
机构:
CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE

Lorin, A
论文数: 0 引用数: 0
h-index: 0
机构:
CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE

Nunzi, JM
论文数: 0 引用数: 0
h-index: 0
机构:
CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE

Schalchli, A
论文数: 0 引用数: 0
h-index: 0
机构:
CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE

Benattar, JJ
论文数: 0 引用数: 0
h-index: 0
机构:
CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE

Vital, D
论文数: 0 引用数: 0
h-index: 0
机构:
CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE CENS, CEA,DRECAM,SERV PHYS ETAT CONDENSE, F-91191 GIF SUR YVETTE, FRANCE
[6]
Metal diffusion from electrodes in organic light-emitting diodes
[J].
Lee, ST
;
Gao, ZQ
;
Hung, LS
.
APPLIED PHYSICS LETTERS,
1999, 75 (10)
:1404-1406

Lee, ST
论文数: 0 引用数: 0
h-index: 0
机构:
City Univ Hong Kong, Ctr Super Diamond & Adv Films, Hong Kong, Peoples R China City Univ Hong Kong, Ctr Super Diamond & Adv Films, Hong Kong, Peoples R China

Gao, ZQ
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, Ctr Super Diamond & Adv Films, Hong Kong, Peoples R China

Hung, LS
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, Ctr Super Diamond & Adv Films, Hong Kong, Peoples R China
[7]
Bubble formation in organic light-emitting diodes
[J].
Liao, LS
;
He, J
;
Zhou, X
;
Lu, M
;
Xiong, ZH
;
Deng, ZB
;
Hou, XY
;
Lee, ST
.
JOURNAL OF APPLIED PHYSICS,
2000, 88 (05)
:2386-2390

Liao, LS
论文数: 0 引用数: 0
h-index: 0
机构:
City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China

He, J
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China

Zhou, X
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China

Lu, M
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China

Xiong, ZH
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China

Deng, ZB
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China

Hou, XY
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China

Lee, ST
论文数: 0 引用数: 0
h-index: 0
机构: City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China
[8]
Formation and growth of black spots in organic light-emitting diodes
[J].
McElvain, J
;
Antoniadis, H
;
Hueschen, MR
;
Miller, JN
;
Roitman, DM
;
Sheats, JR
;
Moon, RL
.
JOURNAL OF APPLIED PHYSICS,
1996, 80 (10)
:6002-6007

McElvain, J
论文数: 0 引用数: 0
h-index: 0
机构:
HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

Antoniadis, H
论文数: 0 引用数: 0
h-index: 0
机构:
HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

Hueschen, MR
论文数: 0 引用数: 0
h-index: 0
机构:
HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

Miller, JN
论文数: 0 引用数: 0
h-index: 0
机构:
HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

Roitman, DM
论文数: 0 引用数: 0
h-index: 0
机构:
HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

Sheats, JR
论文数: 0 引用数: 0
h-index: 0
机构:
HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

Moon, RL
论文数: 0 引用数: 0
h-index: 0
机构:
HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA
[9]
Lifetime and degradation effects in polymer light-emitting diodes
[J].
Parker, ID
;
Cao, Y
;
Yang, CY
.
JOURNAL OF APPLIED PHYSICS,
1999, 85 (04)
:2441-2447

Parker, ID
论文数: 0 引用数: 0
h-index: 0
机构: UNIAX Corp, Goleta, CA 93117 USA

Cao, Y
论文数: 0 引用数: 0
h-index: 0
机构: UNIAX Corp, Goleta, CA 93117 USA

Yang, CY
论文数: 0 引用数: 0
h-index: 0
机构: UNIAX Corp, Goleta, CA 93117 USA
[10]
Operation characteristics and degradation of organic electroluminescent devices
[J].
Sato, Y
;
Ichinosawa, S
;
Kanai, H
.
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS,
1998, 4 (01)
:40-48

Sato, Y
论文数: 0 引用数: 0
h-index: 0
机构:
Mitsubishi Chem Corp, Yokohama Res Ctr, Aoba Ku, Yokohama, Kanagawa 227, Japan Mitsubishi Chem Corp, Yokohama Res Ctr, Aoba Ku, Yokohama, Kanagawa 227, Japan

Ichinosawa, S
论文数: 0 引用数: 0
h-index: 0
机构:
Mitsubishi Chem Corp, Yokohama Res Ctr, Aoba Ku, Yokohama, Kanagawa 227, Japan Mitsubishi Chem Corp, Yokohama Res Ctr, Aoba Ku, Yokohama, Kanagawa 227, Japan

Kanai, H
论文数: 0 引用数: 0
h-index: 0
机构:
Mitsubishi Chem Corp, Yokohama Res Ctr, Aoba Ku, Yokohama, Kanagawa 227, Japan Mitsubishi Chem Corp, Yokohama Res Ctr, Aoba Ku, Yokohama, Kanagawa 227, Japan