A novel method to predict the pull-in voltage in a closed form for micro-plates actuated by a distributed electrostatic force

被引:89
作者
Chao, Paul C-P [1 ]
Chiu, C-W [1 ]
Tsai, C-Y [1 ]
机构
[1] Chung Yuan Christian Univ, R&D Ctr Membrane Technol, Dept Mech Engn, Chungli 32023, Taiwan
关键词
D O I
10.1088/0960-1317/16/5/016
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 [电气工程]; 0809 [电子科学与技术];
摘要
This study is devoted to finding the precise pull-in voltage/position of a micro-device formed by two parallel charged plates. Pull-in is a phenomenon where the electrostatic force induced by the applied voltage across two plates of the device exceeds the elastic, restoring force exerted by the deformed plates, leading to a contact between the two plates. To offer a precise prediction of the pull-in, a dynamic model in the form of a partial differential equation (PDE) is established based on the equilibrium among plate flexibility, residual stress and distributed electrostatic forces. The Galerkin method is employed to decompose the established PDE into discrete modal equations. By considering lower order modes and solving them, one arrives at a prediction of plate deflection in terms of the applied bias voltage. Approximating the solved deflection by a fifth-order series and full-order numerical integration, the pull-in position and voltage are successfully approximated. The pull-in position in terms of center deflection of the deformed plate is found to be 48% of the air gap between the plates, which presents a better estimation than the commonly used one-third of the gap derived by all past studies based on a less realistic one-dimensional lump model. A closed form of the pull-in voltage is derived to offer design guidelines for the device prior to production. The aforementioned theoretical findings are finally validated by finite element and experimental studies on a MEMS device of parallel charged micro-plates designed and fabricated in the laboratory.
引用
收藏
页码:986 / 998
页数:13
相关论文
共 23 条
[1]
Analytical and finite element model pull-in study of rigid and deformable electrostatic microactuators [J].
Cheng, J ;
Zhe, J ;
Wu, XT .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2004, 14 (01) :57-68
[2]
CHIK KD, 1997, P SPIE INT SOC OPT E, V12, P972
[3]
Development of a microelectromechanical system pressure sensor for rehabilitation engineering applications [J].
Ho, JJ ;
Fang, YK ;
Hsieh, MC ;
Ting, SF ;
Chen, GS ;
Ju, MS ;
Chen, TY ;
Huang, CR ;
Chen, CY .
INTERNATIONAL JOURNAL OF ELECTRONICS, 2000, 87 (06) :757-767
[4]
KEITH M, 2004, SOIMUMPS DESIGN HDB
[5]
Kim E. S., 1989, International Electron Devices Meeting 1989. Technical Digest (Cat. No.89CH2637-7), P880, DOI 10.1109/IEDM.1989.74193
[6]
Koester ID, 2003, POLYMUMPS DESIGN HDB
[7]
Pull-in dynamics of an elastic beam actuated by continuously distributed electrostatic force [J].
Krylov, S ;
Maimon, R .
JOURNAL OF VIBRATION AND ACOUSTICS-TRANSACTIONS OF THE ASME, 2004, 126 (03) :332-342
[8]
MEMS widely tunable lasers for WDM system applications [J].
Liu, AQ ;
Zhang, XM ;
Tang, DY .
APOC 2002: ASIA-PACIFIC OPTICAL AND WIRELESS COMMUNICATIONS, OPTICAL SWITCHING AND OPTICAL INTERCONNECTION II, 2002, 4907 :186-194
[9]
Mehner JE, 2000, J MICROELECTROMECH S, V9, P270, DOI 10.1109/84.846708
[10]
AC transfer function of electrostatic capacitive sensors based on the 1-D equivalent model:: Application to silicon microphones [J].
Nadal-Guardia, R ;
Brosa, AM ;
Dehé, A .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2003, 12 (06) :972-978