CVD diamond films for synchrotron radiation beam monitoring

被引：2

作者：

Dabagov, SB ^{[1
]}

Vlasov, II ^{[1
]}

Murashova, VA ^{[1
]}

Negodaev, MV ^{[1
]}

Ralchenko, VG ^{[1
]}

Fedorchuk, RV ^{[1
]}

Yakimenko, MN ^{[1
]}

机构：

[1] Ist Nazl Fis Nucl, Lab Nazl Frascati, I-00044 Frascati, Italy

来源：

DETECTORS FOR CRYSTALLOGRAPHY AND DIFFRACTION STUDIES AT SYNCHROTRON SOURCES | 1999年 / 3774卷

关键词：

X-ray detector; diamond film; synchrotron radiation; ion-beam bombardment;

D O I：

10.1117/12.367118

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Free-standing polycrystalline diamond films grown by microwave plasma CVD technique were tested for detection X-ray radiation from a synchrotron source. Two different configurations of collection electrodes on diamond were used. The first (sandwich) geometry uses a thin amorphous conducting layers formed by nitrogen ion irradiation on both sides of the diamond plate. The second (planar) one, which showed better characteristics, comprises of an interdigitated planar array of metallic contacts on a face exposed to photon flux. However, in both cases a polarization effect that leads to a decrease of the detector response with exposition time, was observed. Better device performance is expected for diamond films of improved quality.

引用

页码：122 / 127

页数：6

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