Correlation of growth of pentacene films at various gas ambience conditions to organic field-effect transistor characteristics

被引:24
作者
Chou, W. Y. [1 ]
Mai, Y. S.
Cheng, H. L.
Yeh, C. Y.
Kuo, C. W.
Tang, F. C.
Shu, D. Y.
Yew, T. R.
Wen, T. C.
机构
[1] Natl Cheng Kung Univ, Inst Electroopt Sci & Engn, Tainan 70101, Taiwan
[2] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan
[3] Natl Cheng Kung Univ, Dept Chem Engn, Tainan 701, Taiwan
关键词
organic thin film transistors; pentacene; deposition ambient conditions; crystalline size; molecular ordering; XRD;
D O I
10.1016/j.orgel.2006.05.007
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Pentacene based thin-film transistors (TFTs) have been fabricated using pentacene films grown under various ambiences, such as N-2, H-2, Ar, He, and high vacuum, to define correlation of the device performance, in particular mobility properties, to molecular ordering in pentacene films. The field-effect mobility of 0.24 cm(2)/Vs was obtained from TFTs fabricated under 2 x 10(-5) Torr nitrogen ambience, however, the pentacene TFTs fabricated in hydrogen ambience under the same pressure yielded very poor mobility of 0.008 cm(2)/Vs. Pentacene films deposited by thermal evaporation at increased pressure in nitrogen ambience have a high degree of molecular ordering with larger dendritic grains without any surface modification on silicon oxide dielectric. A clean relation between field-effect mobility and XRD estimated crystallites size was obtained. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:445 / 451
页数:7
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