Josephson junctions fabricated by oxygen ion irradiation of YBa2Cu3O7-x thin films

被引：4

作者：

Hollkott, J

Hu, S

Becker, C

Auge, J

Spangenberg, B

Kurz, H

Zakharov, ND

Hesse, D

Hollander, B

机构：

[1] MAX PLANCK INST MIKROSTRUKTURPHYS, D-06120 HALLE, GERMANY

[2] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, D-52425 JULICH, GERMANY

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1997年 / 7卷 / 02期

关键词：

D O I：

10.1109/77.622215

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Ion irradiated microbridges are an interesting type of Josephson Junction, because their technological requirements can be very low. In this paper a specialized fabrication process and the electrical characterization of the fabricated devices are reported on. The ICRN product at 77K is about 24 mu V. The phase coherence was proven by measurements on DC-SQUIDs made of these Junctions, To get a deeper insight of the damage produced by ion irradiation, YBa2Cu3O7-x, thin films have been investigated by high resolution transmission electron microscopy (HRTEM) and Rutherford backscattering spectroscopy (RBS).

引用

页码：3674 / 3677

页数：4

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