Optoelectronic properties of CuPc thin films deposited at different substrate temperatures

被引：26

作者：

Della Pirriera, M. ^{[1
]}

Puigdollers, J. ^{[1
]}

Voz, C. ^{[1
]}

Stella, M. ^{[2
]}

Bertomeu, J. ^{[2
]}

Alcubilla, R. ^{[1
]}

机构：

[1] Univ Politecn Cataluna, Dept Elect Engn, Micro & Nanotechnol Grp, ES-08034 Barcelona, Spain

[2] Univ Barcelona, Dept Fis Aplicada & Opt, E-08007 Barcelona, Spain

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2009年 / 42卷 / 14期

关键词：

MOLECULAR-BEAM DEPOSITION; COPPER PHTHALOCYANINE; ELECTRONIC-STRUCTURE; ABSORPTION SPECTRA; SOLAR-CELLS;

D O I：

10.1088/0022-3727/42/14/145102

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Structural and optical characterization of copper phthalocyanine thin film thermally deposited at different substrate temperatures was the aim of this work. The morphology of the films shows strong dependence on temperature, as can be observed by atomic force microscopy and x-ray diffraction spectroscopy, specifically in the grain size and features of the grains. The increase in the crystal phase with substrate temperature is shown by x-ray diffractometry. Optical absorption coefficient measured by photothermal deflection spectroscopy and optical transmittance reveal a weak dependence on the substrate temperature. Besides, the electro-optical response measured by the external quantum efficiency of Schottky ITO/CuPc/Al diodes shows an optimized response for samples deposited at a substrate temperature of 60 degrees C, in correspondence to the I-V diode characteristics.

引用

页数：5

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