Study of carbon impurity generation by chemical sputtering in JT-60U

被引:9
作者
Higashijima, S
Kubo, H
Sugie, T
Shimizu, K
Asakura, N
Itami, K
Hosogane, N
Sakasai, A
Konoshima, S
Sakurai, S
Takenaga, H
机构
[1] Japan Atomic Energy Research Inst, Ibaraki
关键词
JT-60U; tokamak; impurity source; chemical erosion; low Z wall material;
D O I
10.1016/S0022-3115(96)00567-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
CD/CH-band intensities emitted from hydrocarbon molecules have been measured in the divertor region of JT-60U and the chemical sputtering yield of methane was estimated as a function of the surface temperature and the deuterium ion flux. The chemical sputtering yield increases with the surface temperature and decreases with increasing ion flux density in the L-mode plasmas. The B4C converted CFC tiles are installed in JT-60U and it is found that the chemical sputtering of B4C converted CFC tiles is suppressed in comparison to normal CFC tiles.
引用
收藏
页码:574 / 578
页数:5
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